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Use of a High-Temperature X-Ray Diffractometer to Measure the Temperature Dependence of Reflection Intensities*

Published online by Cambridge University Press:  06 March 2019

Earle Ryba  and
P. Chiotti
Earle Ryba
Affiliation:
Pennsylvania State University, University Park, Pennsylvania
P. Chiotti
Affiliation:
Iowa State College, Ames, Iowa
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Abstract

The temperature dependence of the reflection intensities from copper was examined in order to determine the mean-square vibration amplitudes of the atoms in the metal. The reflections from a prealigned single crystal were examined in a Norelco diffractometer outfitted with a high-temperature chamber designed by Chiotti. The intensities of the (400) reflection for copper were measured at temperatures from 13 to 1000°C. Difficulty was experienced in obtaining reproducible intensity measurements, and it is suggested that this was due to changes in the mosaic structure of the single crystal during thermal cycling.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 257 - 263
Copyright
Copyright © International Centre for Diffraction Data 1961

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Footnotes

*

Work done in the Ames Laboratory of the Atomic Energy Commission.

References

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