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An Examination of the Overall Stability of an XRF Spectrometer with Special Reference to Fourier Analysis of Temporal Variation

Published online by Cambridge University Press:  06 March 2019

T. K. Smith
T. K. Smith*
Affiliation:
British Geological Survey London, United Kingdom
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Extract

In any analytical method, one of the first considerations in obtaining precise and accurate results is the stability of the instrument. Progressive refinement in design and manufacturing techniques over many years has led to short-term stability of X-ray generation, transmission and detection in XRF spectrometers of a magnitude such that, in favourable cases, the random process of emission (and to some extent, absorption) is the major source of error; superimposed on this, however, are other variations, some of them periodic.

Many processes modify the intensity of X-rays recorded by a spectrometer's sealer and timer: besides those produced by the instrument itself there are potential external perturbations perhaps reverting to electricity generating stations or even further. More important effects may be caused by local features such as ambient temperature and pressure, and in the case of improper setting of machine conditions or of existence of a fault, enhancement may be observed.

Type
III. New Techniques and Instrumentation in XRF
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 103 - 106
Copyright
Copyright © International Centre for Diffraction Data 1984

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References

Chamberlain, J.E., 1979, “The Principles of Interferometric Spectroscopy” John Wiley, Chichester.Google Scholar
Champeney, D.C., 1973, “Fourier Transforms and their Physical Applications”, Academic Press, London.Google Scholar
Packard, Hewlett, 1982, “Series 80 Waveform Analysis Pac”, Hewlett Packard, Corva11is.Google Scholar