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The Application of a Soft X-Ray Spectrometer to Study the Oxygen and Fluorine Emission Lines from Oxides and Fluorides

Published online by Cambridge University Press:  06 March 2019

R. A. Mattson  and
R. C. Ehlert
R. A. Mattson
Affiliation:
General Electric Company, Milwaukee, Wisconsin
R. C. Ehlert
Affiliation:
General Electric Company, Milwaukee, Wisconsin
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Abstract

Results are shown for O and F K emission lines from several oxide and fluoride compounds. The spectra are examined for both structure and wavelength. Excitation of the spectra is by both electrons and X-rays. The emission spectra from several oxygen- and fluorine-bearing gases and the influence of the composition of the diffracting crystal on the shape of the observed oxygen spectra are also discussed. Curved crystals of potassium acid phthalate and lead stearate, and a thin-window flow proportional counter, are used to obtain the results.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 9: Fourteenth Annual Conference on Applications of X-ray Analysis, August 25-27, 1965 , 1965 , pp. 471 - 486
Copyright
Copyright © International Centre for Diffraction Data 1965

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References

1. Ehlert, R. C. and Mattson, R. A., “The Characteristic X-Rays from Boron and Beryllium,” this volume, p. 456.Google Scholar
2. O'Bryan, H. M. and Skinner, H. W. B., “The Soft X-Itay Spectroscopy of Solids,” Proc.Roy. Soc. (London) Ser. A 176: 229, 1940.Google Scholar
3. Tyren, F., “Precision Measurements of Soft X-Rays with a Concave Grating,” Nova Acta Regive Soc. Sci. Upsaliensis 12: 7–66, 1940.Google Scholar
4. Lukirskii, A. P., Zimkina, T. M., and Brytov, I. A., “Study of X-Ray Spectra In the Region of Wavelengths Greater than 15 Â Using a Spectrometer with a Gold-Covered Diffraction Grating,” Op. Spectr. 16: 372-5, April, 1964.Google Scholar
5. Fischer, D. W., “Effect of Chemical Combination on the X-Ray K Emission Spectra of Oxygen and Fluorine,” J. Chem. Phys. 42: 3814, 1 June, 1965.Google Scholar
6. Holliday, J. E., “Soft X-Ray Emission Spectroscopy in the 13 to 44 A Region,” J. Appl. Phvs. 33: 3259, November, 1962.Google Scholar
7. Sawada, M., Zembei, F., and Kosugi, J., “Influence of Lattice Bonding on the K-Series of Fluorine,” J. Proc. Physico-Math Soc. Jap, 3rd Ser. 26 (1-2), January-February, 1944.Google Scholar
8. Mattson, R. A., “Some Measurements of Carbon K Excitation in a New Ultra-Soft X-Ray Spectrometer,” paper presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis, Denver, Colorado, August 24-26, 1965.Google Scholar
9. Fischer, D. W., Private Communication.Google Scholar
10. Liefeld, R. J., “L Emission from First Transition Metals Near Threshold Excitation,” presented at the International Conference on Physics of X-Ray Spectra, Cornell University, Ithaca, New York, 22-24 June, 1965.Google Scholar
11. Fischer, D. W., “The Use of Soft X-Rays for Materials Analysis: The L Emission Spectra of the Fe Grouro Transition Metals and Their Oxides,” ML TDR 64-263, September, 1964.Google Scholar