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Application of Heavy Charged Particle Induced X-Ray Emission to the Trace Element Analysis of Human Tissue and Blood Serum

Published online by Cambridge University Press:  06 March 2019

R. L. Watson ,
C. J. McNeal  and
F. E. Jenson
R. L. Watson
Affiliation:
Department of Chemistry and Cyclotron Institute, Texas A&M University, College Station, Texas 77843
C. J. McNeal
Affiliation:
Department of Chemistry and Cyclotron Institute, Texas A&M University, College Station, Texas 77843
F. E. Jenson
Affiliation:
Department of Chemistry and Cyclotron Institute, Texas A&M University, College Station, Texas 77843
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Abstract

Measurements of peak-to-background ratios for K x-ray production by 1.7 MeV/amu protons, alpha particles, carbon ions, and neon ions have been carried out for the purpose of determining the optimum projectile atomic number for particle induced x-ray emission analysis. The feasibility of applying the method to the trace element analysis of thick samples of tissue and blood serum has been explored.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 288 - 298
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

1. Johansson, T. B., Akselsson, R., and Johansson, S. A. E., “X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level,” Nuci. Instr. 84, 141–143 (1970).Google Scholar
2. Watson, R.L., Sjurseth, J. R., and. Howard, R. W., “An Investiga-tion of the analytical Capabilities of X-Ray Emission Inducedlay High Energy Alpha Particles/’ Nucl. Instr. 93, 69–76 (1971).Google Scholar
3. Kliwer, J. K., Kraushaar, J. J., Ristinen, R. A., Rudolph, H., and Smythe, W. R., “Trace Element Analysis by Observation of Characteristic X-Rays,” Bull. Am. Phys. Soc. 17, 545 (1972).Google Scholar
4. Cooper, J. A., “Comparison of Particle and Photon Excited X-Ray Fluorescence Applied to Trace Element Measurements of Environmental Samples,” Nucl. Instr. 106, 525–538 (1973).Google Scholar
5. Valkovic, V., Liebert, R. B., Zabel, T., Larson, H. T., Milijanic, D., Wheeler, R. M., and Phillips, G. C., “Trace Element Analysis Using Proton-Induced X-Ray Emission Spectroscopy,” Nucl. Instr. 114, 573–579 (1974).Google Scholar
6. Perry, S. K. and Brady, F. P., “A Comparative Study of Alpha and X-Ray induced X-Ray Emission for Elemental Analysis,” Nucl. Instr. 108, 389–396 (1973).Google Scholar
7. Flocchini, R. G., Feeney, P. J., Sommerville, R. J., and Cahill, T, A., “Sensitivity Versus Target Backings for Elemental Analysis by Alpha Excited X-Ray Fluorescence,” Nucl. Instr. 100, 397–402 (1972).Google Scholar
8. Herman, A. W., McNelles, L. A., and Campbell, J. L., “Target Backings for Charged Particle Induced X-Ray Fluorescence Analysis,” Nucl. Instr. 109, 429–431 (1973).Google Scholar
9. Herman, A. W., McNelles, L. A., and Campbell, J, L., “Choice of Physical Parameters in Charged Particle Induced X-Ray Fluorescence Analysis,” Int. J. Applied Radiation and Isotopes 24, 677–688 (1973).Google Scholar
10. Folkmann, F., Gaarde, C., Huus, T., and Kemp, K., “Proton Induced X-Ray Emission as a Tool for Trace Element Analysis,” Nucl. Instr. 116, 487–499 (1974).Google Scholar
11. Storm, E. and Israel, H. I., “Photon Cross Sections from 1 kev to 100 MeV for Elements z = 1 to Z = 100,” Nucl. Data Tables A7, 565–681 (1970).Google Scholar
12. Lehninger, A. L., Biochemistry (Worth Publishing Co., New York, 1972). p. 19.Google Scholar
13. Garcia, J. D., “Inner-Shell Ionizations by Proton Impact,” Phys. Rev. A1, 280–285 (1970).Google Scholar
14. Watson, R. L., Bowman, H. R., and Thompson, S. G., “K X-Ray Yields of Primary 252Cf Fission Products,” Phys. Rev. 162, 1169–1174 (1967).Google Scholar