Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-26T23:06:11.288Z Has data issue: false hasContentIssue false
  • English
  • Français

Application of XRF in the Aluminum Industry

Published online by Cambridge University Press:  06 March 2019

Frank R. Feret
Frank R. Feret*
Affiliation:
Alcan International Limited Arvida Research and Development Centre Jonquière, Québec., Canada G7S 4K8
Get access

Extract

X-ray fluorescence analysis has been used in the aluminum industry since the beginning of the 1950's. Initial applications involved predominantly raw materials such as bauxite. During the last decades its use expanded to every stage of aluminum production and today, XRF analysis is a recognized analyticaI technique, applied routinely in exploration, reduction and fabrication processes. Typical XRF applications in the aluminum industry at present are listed in Table 1. The number of determinations given represents usual industrial requirements, and may vary between laboratories. The sample preparation techniques are again the most commonly used for the applications.

Type
IV. On-Line, Industrial and Other Applications of XRS
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 121 - 137
Copyright
Copyright © International Centre for Diffraction Data 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Arias, L.G., Note 329, Siemens Analytical X-ray Instruments, 1992.Google Scholar
2. Matocha, C.K., Proceedings from the 6th International Conference on Light Metals (ILMT) Leoben/Vienna (Austria), June 1975.Google Scholar
3. Tertian, R., Trav. Com. Int. Etude Bauxites Alumine Alum., ICSOBA, 1976, Vol. 13, pp. 339-350.Google Scholar
4. Labrecque, J.J., Schorin, H., Applied Spectroscopy, 1980, Vol. 34, No. 1, pp. 39–43.Google Scholar
5. Kusel'man, I.I., Michetina, L.I., Khubedzhev, F.A., Zh. Anal. Khim., 1985, Vol. 45, No. 8, pp. 1533–1536.Google Scholar
6. East, F., Light Metals (Warrendale, PA), 1985, pp. 239-248.Google Scholar
7. Sawhney, K.J.S., Lodha, G.S., Singh, B.R., Nucl. Geophys. 1989, Vol. 3, No. 2, pp. 125–130.Google Scholar
8. Yuan, Hanzhang, Liu, Yang, Qin, Ying, Fenxi Huaxue 1990, Vol. 18 No. 5, pp. 451–453.Google Scholar
9. Strahl, E.O., Proc. Bauxite Symp. 5th, Editor Lyew-Ayee, A., 1982.Google Scholar
10. Bredell, J.H., Economic Geology, 1983, Vol. 78, pp. 319–325.Google Scholar
11. Schorin, H., Carias, O., Chem. Geol., 1987, Vol. 60, No. 1-4, pp. 199–204.Google Scholar
12. Feret, F., “Characterization of Aluminum Bearing Minerals by XRF/XRD” - XXV Colloquium Spectroscopicum Internationale, Toronto, Ontario, June 21-26, 1987.Google Scholar
13. Solymár, K., Sajó, I., Steiner, J., Zöldi, J., Light Metals, 1992, pp. 209-223.Google Scholar
14. Feret, F.; Giasson, F., Light Metals (Warrendale, Pa.), 1991, pp. 187-191.Google Scholar
15. Medicus, G., Ackermann, G., Fresenius., J. Anal. Chem, 1991, Vol. 339, No. 4, pp. 226–229.Google Scholar
16. Jecko, G., Ravaine, D., Cah. Inf. Tech./Rev. Metal I. 1987, Vol. 84, No, 1, pp. 33–46.Google Scholar
17. Yuan, H., Liu, Y., Qin, Y., Zhang, F., Guo, S., Ning, A., 1990, Guangpuxue Yu Guangpu Fenxi, Vol. 10, No. 4, pp. 42–45.Google Scholar
18.British Standards Institution, British Standard Report: BS 1902: Section 9.2 1987, p. 12.Google Scholar
19.British Standards Institution British Standard Report: BS 1902: Section 9.1 1987, p. 16.Google Scholar
20. Tandon, A. K., Sinhamahaptra, P.K., Pani, S. S., Chem. Era, 1982, Vol. 18, No. 10, pp. 235–240.Google Scholar
21. Hughes, H., Metal I. Mater. Technol., 1984, Vol. 16, No. 3, pp. 137–140.Google Scholar
22. Magyar, B., Bachmann, H. J., Microchimica Acta, 1983, Vol. 11, No. 5-6, pp. 327–343.Google Scholar
23. Voros, K., Zabraczki, J., Banyasz, Kohasz. Lapok, Kohasz., 1987, 120(3), pp. 123–126.Google Scholar
24. Pan'kov, S. D., Smagunova, A. N., Pan'kova, L.M., Pisareva, V. I., Zavod. Lab., 1987, Vol. 53, No. 12, pp. 79–81.Google Scholar
25. Agrawal, R. M., Kapoor, S.K., X-Ray Spectrometry, 1989, Vol., 18, No. 4, pp. 151–155.Google Scholar
26. Draeger, G., Leiro, J. A., Phys. Rev. B: Condens. Matter, 1990, Vol. 41 No. 18, pp. 12919–12921.Google Scholar
27. Kyoichiro, Takashima, Tokunosuke, Nakajima, J. Spectroscop. Soc. Jap., Nov. 1969, Vol. 18, pp. 262–267.Google Scholar
28. Katsumi, Ohno, Trans. Nat. Res. Inst. Metals, 1971, Vol. 13, No. 2, pp. 7–12.Google Scholar
29. Seidel, D., Schulz, E., GIT (Glas-Instrum-Tech) Fachz. Lab., 1971, Vol. 15, No. 12, pp. 1401–1405.Google Scholar
30. Feret, F., Advances in X-Ray Analysis, 1990, vol. 33, pp. 685–690.Google Scholar
31. Pandey, H.D., Prasad, M.S., Spectrochimica Acta, Part B., 1983, Vol. 38, No. 10, pp. 1371–1372.Google Scholar
32. Lux, G., Frenzel, P., Z. Chem., 1983, Vol. 23, No. 5, pp. 192–193.Google Scholar
33. Tandon, A. K., Sinhamahaptra, P.K., Pani, S. S., Chem. Era, 1982, Vol. 18, No. 10, pp. 235–240.Google Scholar
34. Machula, A. A., Lisoveski, I. P., Stnakhtin, L. A., Zh. Anal. Khim., 1983, Vol. 38, No. 1, pp. 75–79.Google Scholar
35. Alvarez, M., Alvarado, J., Cristiano, A.R., Marco, L. M., Perez, M. M., J. Radioanal. Nucl. Chem., 1990, Vol. 144, No. 5, pp. 327–334.Google Scholar
36. Egorova, V.A., Mashkovich, L.A., Kuteinikov, A. F., Cheblakova, E.G., Zh. Anal. Khim., 1985, Vol. 40, No. 7, pp. 1254–1256.Google Scholar
37. Pan'kov, S.D., Smagunova, A. N., Pan'kova, L.M., Zavod. Lab., 1987, Vol. 53, No. 11, pp. 91–93.Google Scholar
38. Seidel, D., Schulz, E., GIT (Glas-Instrum-Tech) Fachz. Lab., 1971, Vol. 15, No. 12, pp. 1401–1405.Google Scholar
39. Kocman, V., Foley, L., Landsberger, S., Carbon, 1989, Vol. 27, No. 2, pp. 185–190.Google Scholar
40. Kocman, V., Advances in X-Ray Analysis, 1987, Vol. 30, pp. 243–249.Google Scholar
41. Baggio, S., Foresio, C., Aluminium (Duesseldorf), 1980, Vol. 56, No. 4, pp. 276–278.Google Scholar
42. Lueschow, H.M., Aluminum, 1972, Vol. 48, pp. 783–789.Google Scholar
43. Feret, F., Light Metals (Warrendale, Pa.), 1988, pp. 697-702.Google Scholar
44. Ohno, K., Trans, Nat. Res. Inst, Metals, 1971, Vol. 13, No. 2, pp. 7–12.Google Scholar
45. Yoshikawa, S., Hisayuki, T., Kishimoto, N., Bunseki Kagaku, 1983, Vol. 32, No, 5, pp. T45-T49.Google Scholar
46. Lucas, H., Suffa, H., Moser, G., Patent DD 263, 358 (Germany), 1988.Google Scholar
47. Lux, G., Frenzel, P., Z. Chem., 1983, Vol. 23, No. 5, pp. 192–193.Google Scholar
48. Tandon, A. K., Sinhamahaptra, P.K., Pani, S. S., Chem. Era, 1982, Vol. 18, No. 10, pp. 235–240.Google Scholar
49. Blank, A. B., Belenko, L. E., Shevtsov, N. I., Zn. Anal. Khim., 1986, Vol. 41, No. 2, pp. 286–288.Google Scholar
50. Seidel, D., Schulz, E., GIT (Glas-Instrum-Tech), Fachz. Lab., 1971, Vol. 15, No. 12, pp. 1401–1405.Google Scholar
51. Honda, T., Okui, Y. Sato, Y. Yoshida, M., Shinku (Journal of the Vacuum Society of Japan), p. 33(12).Google Scholar
52. Veverka, I., Maly, L., Hutn. Listy, 1989, Vol. 44, No. 6, pp. 428–430.Google Scholar
53. Yan, Q., Du, X., Yin, Z., Den, P., Liu, D., Fenxi Shiyanshi, 1987, Vol. 6, No. 1 , pp. 15–17.Google Scholar
54. Kutty, K.V.G., Rajagopalan, S., Mathews, C.K., X-Ray Spectrometry, 1988, Vol. 17, No. 6, pp. 239–241.Google Scholar
55. Szaloki, I. , X-Ray Spectrometry, 1988, Vol. 17, No. 2, pp. 75–80.Google Scholar
56. Gurvich, Y. M., Advances in X-ray Analysis, 1986, Vol. 30, pp. 265–272.Google Scholar
57. Respaldiza, M.A., Madurga, G., Soares, J. C., Nuclear Instruments and Methods in Physics Research B28, 1987, p. 67.Google Scholar
58. Feret, F.R., Sokolowski, J., Spectroscopy International, 1990, Vol. 2, No 1, pp. 34–39.Google Scholar
59. Makjanic, J., Orlic, I., Valkovic, V., J. Radioanal. Nucl. Chem., 1985, Vol. 91, pp. 205–213.Google Scholar
60. Forte, M., X-Ray Spectrometry, 1983, Vol. 12, pp. 115-117.Google Scholar
61. Helan, V., Hutn. Listy, 1989, Vol. 44, No. 10, pp. 727–730.Google Scholar
62. Wheeler, B.D., Spectroscopy (Eugene, Oregon), 1987, Vol. 2, No. 11, pp. 32–35.Google Scholar
63. Alluyn, P., Dams, R., J. Trace Microprobe Tech., 1987, Vol. 5, No. 2-3, pp. 211–228.Google Scholar
64. Nikitina, O. I., Antipenko, L. L., Ivanova, N.K., Zavod. Lab., 1986, Vol. 52, No. 8, pp. 37–38.Google Scholar
65. Vandecasteele, C., Alluyn, F., Dewaele, J., Dams, R., Analytical Chemistry, 1985, Vol. 57, No. 13, pp. 2549–2552.Google Scholar
66. Alluyn, F., Dams, R., Hoste, J., Anal. Chim. Acta, 1985, Vol. 172, pp. 119–126.Google Scholar
67. Senff, U.E., Anal. Chim. Acta, 1985, Vol. 169, pp. 201–207.Google Scholar
68. Sofilic, T., Maljkovic, D., X-ray Spectrometry, 1989, Vol. 18, No. 1, pp. 25–29.Google Scholar
69. Pandey, H.D., Applied Spectroscopy, 1984, Vol. 38, No. 1 , pp. 90–92.Google Scholar
70. Feret, F., Canadian Journal of Spectroscopy, 1986, Vol. 31, No. 1 , pp. 15–21.Google Scholar
71. Dornemann, A., Kothen, K.H., Rudan, D., Fresenius., Z. Anal, Chem., 1987, Vol. 326, No. 3, pp. 232–236.Google Scholar
72. Kaneko, K., Kumashiro, Y., Hirabayashi, M., Yoshida, S., X-sen Bunseki no Shinpo, 1988, Vol. 20, pp. 161–166.Google Scholar
73. Kocman, V., Peel, T.E., and Tomlinson, H., Commun. Soil Sci . Plant Anal., 1991, 22 (19&20), pp, 2063-2075.Google Scholar