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Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers

Published online by Cambridge University Press:  06 March 2019

John F. Croke  and
Joseph A. Nicolosi
John F. Croke
Affiliation:
Philips Electronic Instruments, Inc., Mahwah, New Jersey 07430
Joseph A. Nicolosi
Affiliation:
Philips Electronic Instruments, Inc., Mahwah, New Jersey 07430
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Extract

Over the past 30 years, X-ray fluorescence spectrometry has become one of the more valuable methods for the qualitative and quantitative analysis of materials. Today, there are many methods of instrumental analysis available, and among the factors that will be taken into account in the method of selection are:

  1. - Accuracy

  2. - Range of application

  3. - Speed

  4. - Sensitivity

  5. - Reliability

No one technique can provide all of the features that a given analyst requires. XRF does offer good overall performance over the widest range of elements. Speed, accuracy, and versatility are among the features that have made XRF the method of choice for over 15,000 laboratories worldwide.

Type
IV. Recent Developments in XRF Dispersion Devices
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 225 - 236
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

[1] Nicolosi, J.A., Groven, J.P., and Merlo, D., “Use of Layered Synthetic Micros tructures for Quant. Analysis of Elements: B. o Mg ”, Advances in X-Ray Analysis 30 (1986).Google Scholar
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