Hostname: page-component-cd9895bd7-q99xh Total loading time: 0 Render date: 2024-12-26T21:01:27.050Z Has data issue: false hasContentIssue false
  • English
  • Français

Coordination Analysis by High Resolution X-ray Spectroscopy*

Published online by Cambridge University Press:  06 March 2019

You-Zhao Bai ,
Sei Fukushima  and
Yohichi Gohshi
You-Zhao Bai
Affiliation:
Department of Industrial Chemistry, University of Tokyo Bunkyo-ku, Tokyo 113, Japan
Sei Fukushima
Affiliation:
Department of Industrial Chemistry, University of Tokyo Bunkyo-ku, Tokyo 113, Japan
Yohichi Gohshi
Affiliation:
Department of Industrial Chemistry, University of Tokyo Bunkyo-ku, Tokyo 113, Japan
Get access

Extract

Various X-ray fluorescence spectrometers are now commercially available, and these spectrometers are classified into two categories, i.e., energy dispersive and wavelength dispersive (Table 1). Energy dispersive instruments are of low resolution. Wavelength dispersive instruments are often referred to as high resolution. However, commercially available wavelength dispersive instruments are usually equipped with a one-crystal dispersion unit. Therefore, to be more precise, these instruments could be called medium resolution apparatuses. There are other types of spectrometers which are two- or three-crysral spectrometers, and which are known to have very high resolving power. High resolution X-ray fluorescence spectrometers, however, have rarely been constructed. This is because this type of spectrometer needs a very precise and complicated scanning mechanism, and also because the intensity of X-ray fluorescence is often lost.

Type
II. Mathematical Models and Computer Applications in XRF
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 45 - 52
Copyright
Copyright © International Centre for Diffraction Data 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

The Research Institute of Building Materials Guan Zhuang, Beijing, The People's Republic of China

References

1. Gohshi, Y., “Simple Two Crystal Spectrometer And Its Application to X-Ray Spectrochemical Analysis”, Advances in X-Ray Analysis, Vol.12, 518 (1969)Google Scholar
2. Gohshi, Y., Hukao, Y., Hori, K., “A Wide-range, Single-axes, Vacuum Two-Crystal Spectrometer for Fluorescence X-Ray Analysis”, Spectrochim. Acta, 27B:135 (1972)Google Scholar
3. Gohshi, Y., Ohtsuka, A., “The Application of Chemical Effects in High Resolution X-Ray Spectrometry”, Spectrochim. Acta, 28B:179 (1973)Google Scholar
4. Gohshi, Y., Kamada, H., Kohra, K., Utaka, T., Arai, T., “Wide Range Two-Crystal Vacuum X-Ray Spectrometer for Chemical State Analysis”, Appl. Spectrosc. 36:171 (1982)Google Scholar
5. White, E. W., Mckinstry, H. A., Bates, T.F., “Crystal Chemical Study by X-Ray Fluorescence”, Advances in X-Ray Analysis, Vol.2, 239 (1959)Google Scholar
6. Bai, Y.Z., Fukushima, S., Gohshi, Y., “Coordination State Analysis of Aluminum by Al Ka, — Measurement of 5-coordination A1 —”, Yogyo-Kyokai-Shi, 92:475 (1984)Google Scholar
7. Ono, Y., “Cement krinka kohsei kohbutsu ni kansuru kenkyu”, in: “80-nen day no ceramics”, The Ceramic Society of Japan (1931)Google Scholar
8. White, E. W., Gibbs, G. V., “Structural and Chemical Effects on the A1 Kβ X-Ray Emission Band among Aluminum Containing Silicates and Aluminum Oxides”, The American Mineralogist, 54:931 (1969)Google Scholar