Hostname: page-component-cd9895bd7-gxg78 Total loading time: 0 Render date: 2024-12-29T11:18:11.367Z Has data issue: false hasContentIssue false
  • English
  • Français

Determination of Dislocation Densities in Hexagonal Close-Packed Metals using X-Ray Diffraction and Transmission Electron Microscopy

Published online by Cambridge University Press:  06 March 2019

M. Griffiths ,
J.E. Winegar ,
J.F. Mecke  and
R.A. Holt
M. Griffiths
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
J.E. Winegar
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
J.F. Mecke
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
R.A. Holt
Affiliation:
AECL Research, Chalk River Laboratories Chalk River, Ontario, Canada K0J 1J0
Get access

Abstract

X-ray diffraction (XRD) line-broadening analysis has been used to determine dislocation densities in zirconium alloys with hexagonal closepacked (hep) crystal structures and a complex distribution of dislocations reflecting the plastic, anisotropy of the material. The validity of the technique has been assessed by comparison with direct measurements of dislocation densities in deformed polycrystalline and neutron-irradiated single crystal material using transmission electron microscopy (TEM). The results show that-there is good agreement between the XRD and TEM for measurements on the deformed material whereas there is a large discrepancy for measurements on the irradiated single crystal; the XRD measurements significantly underestimating the TEM observations.

Type
VIII. XRD Profile Fitting, Crystallite Size and Strain Determination
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 593 - 599
Copyright
Copyright © International Centre for Diffraction Data 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Williamson, G.K. and Smallman, R.E., Phil. Mag. 1:34 (1956).Google Scholar
2. Holt, R.A., J. Nucl. Mater. 90:193 (1980).Google Scholar
3. Warren, B.E., “X-Ray Diffraction”, Addison-Wesley, Reading, Massachussetts (1968).Google Scholar
4. Wagner, C.N.L., in “Local Atomic arrangements Studied by X-ray Diffraction”, J.B. Cohen and J.E. Hilllard eds., Gordon and Breach, New York (1965).Google Scholar
5. Ham, R.K., Phil. Mag. 6:1183 (1961).Google Scholar
6. Aqua, E.N. and Owens, C.M., Trans. AIME 239:155 (1967).Google Scholar
7. MacEwen, S.R., Christodoulou, N. and Rodriguez, A.S., Met. Trans. A 21:1093 (1990).Google Scholar