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Determination of the Coherency Strain of γ and γ′ Phases in Nickel-Base Superalloys at High Temperatures

Published online by Cambridge University Press:  06 March 2019

Katsumi Ohno ,
Tadaharu Yokokawa ,
Toshihiro Yamagata ,
Hiroshi Harada ,
Michio Yamazaki  and
Kazumasa Ohsumi
Katsumi Ohno
Affiliation:
National Research Institute for Metals 2-3-12, Nakameguro, Meguro-ku, Tokyo 153, Japan
Tadaharu Yokokawa
Affiliation:
National Research Institute for Metals 2-3-12, Nakameguro, Meguro-ku, Tokyo 153, Japan
Toshihiro Yamagata
Affiliation:
National Research Institute for Metals 2-3-12, Nakameguro, Meguro-ku, Tokyo 153, Japan
Hiroshi Harada
Affiliation:
Research Development Corporation of Japan 2-5-2, Nagata-cho, Chiyoda-ku, Tokyo 100, Japan
Michio Yamazaki
Affiliation:
Research Development Corporation of Japan 2-5-2, Nagata-cho, Chiyoda-ku, Tokyo 100, Japan
Kazumasa Ohsumi
Affiliation:
National Laboratory for High Energy Physics 1-1 Oho, Tsukuba-shi, Ibaragi-ken 305, Japan
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Abstract

A method for using syncrotoron-radiation parallel-beam X-ray diffractometry for precise lattice parameters and strains of γ-γ′ type Nickel base superalloys at elevated temperature is described. The superalloys have γ′ precipitates which are an ordered L12 structure based on Ni3Al, in y-matrices having a disordered FCC structure. Lattice misfit between γ and γ′ phases was very small and peaks reflected from γ and γ′ phases made unresolved clusters of peaks.

Profile fitting with a pseudo-Voigt function is used to resolve overlapping peaks. Instrumental broadening of the peak profile was removed using a deconvolution method. The standard errors of the calculated peak angle were less than 0.002°. The elastic strain of the γ′ precipitates in the alloys were smaller than those of γ-matrices.

Type
IX. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 515 - 526
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

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