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Double-Scanning Diffractometry in the Back-Reflection Region

Published online by Cambridge University Press:  06 March 2019

Hubert W. King  and
Carolyn M. Russell
Hubert W. King
Affiliation:
Imperial College London, England
Carolyn M. Russell
Affiliation:
Imperial College London, England
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Abstract

A scanning range over Bragg angles from −163 to +163° 2θ is obtained by combining a diffractometer capable of scanning both sides of the primary X-ray beam with a very short (3-in.) high-power focused X-ray tube. The ability to scan the included angle 4θ between respective diffraction profiles on either side of the primary beam over the entire range of Bragg angles, provides a direct method of eliminating errors caused by a displacement of the specimen surface from the axis of the goniometer. The method is demonstrated by determining the lattice parameters of standard specimens used in the I.U.Cr. Precision Lattice Parameter Project.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 8: Thirteenth Annual Conference on Applications of X-ray Analysis, August 12-14, 1964 , 1964 , pp. 1 - 10
Copyright
Copyright © International Centre for Diffraction Data 1964

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References

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