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Electron-Probe X-Ray Spectrograph: Design, Evaluation, and Application

Published online by Cambridge University Press:  06 March 2019

J. D. Brown ,
J. W. Thatcher  and
W. J. Campbell
J. D. Brown
Affiliation:
Bureau of Mines, U. S. Department of the Interior College Park, Maryland
J. W. Thatcher
Affiliation:
Bureau of Mines, U. S. Department of the Interior College Park, Maryland
W. J. Campbell
Affiliation:
Bureau of Mines, U. S. Department of the Interior College Park, Maryland
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Abstract

The Bureau of Mines purchased the electron optics, vacuum system, and sample stage assembly for the electron-probe X-ray spectrograph and designed and built the two reflection and two transmission scanning curved-crystal spectrometers. The reflection spectrometers were placed in a vacuum chamber for measurements of long-wavelength X-radiation. Operational characteristics of this spectrograph were determined. A low-alloy stainless-steel sample containing 5 wt. % depleted uranium and a stainless-steel sample containing 20 wt. % gadolinium were analyzed.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 527 - 537
Copyright
Copyright © International Centre for Diffraction Data 1961

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References

1. Thatcher, J. W. and Campbell, W. J., “ Fluorescent X-R ay Spectrographie Probe-De sign and Application,” U.S. Bur, Mines Rept. Invest, 5500, 1959, 23 pp.Google Scholar
2. DuMond, J. W. M., “Crystal Diffraction Spectroscopy of Nuclear X-Rays,* in K. Siegbahn (éd.), Beta- and Gamma-Ray Spectroscopy, North-Holland Publishing Co., Amsterdam, 1955, p. 100.Google Scholar
3. Birks, L. S. and Brooks, E. J., “Uniform Plastic Bending of Crystals for Focusing X-Ray Radiation,” Rev. Sci. Instr., Vol. 24, 1953, p. 992.Google Scholar
4. Kemp, J. W. and Andertnann, G., “Cylindrical Crystal X-Ray Optics,” 5th Annual Corf, on Industrial Applications of X-Ray Analysis, Denver Research Institute, Denver, Colo., August 1956.Google Scholar