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Energy, Aerosols and Ion-Excited X-Ray Emission*

Published online by Cambridge University Press:  06 March 2019

R.G. Flocchini ,
D.J. Shadoan ,
T.A. Cahill ,
R.A. Eldred ,
P.J. Feeney  and
G. Wolfe
R.G. Flocchini
Affiliation:
Crocker Nuclear Laboratory, University of California, Davis
D.J. Shadoan
Affiliation:
Crocker Nuclear Laboratory, University of California, Davis
T.A. Cahill
Affiliation:
Crocker Nuclear Laboratory, University of California, Davis
R.A. Eldred
Affiliation:
Crocker Nuclear Laboratory, University of California, Davis
P.J. Feeney
Affiliation:
Crocker Nuclear Laboratory, University of California, Davis
G. Wolfe
Affiliation:
Crocker Nuclear Laboratory, University of California, Davis
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Abstract

Rapid changes in methods of energy production and utilization are occurring in California, as elsewhere. The affects of such changes upon atmospheric aerosols have been monitored since January, 1973, as part of the continuing study of California aerosols undertaken by U.C. Davis for the California Air Resources Board. A primary goal of the program is to identify aerosol sources in detail, thus allowing energy related components to be isolated and evaluated at many locations throughout the state.

Use of ion-excited x-ray emission as the major (although not exclusive) method of elemental analysis is well suited to this program for a number of reasons. Among them include; 1. The sensitivity allows particle-sized aerosol samples to be easily collected, 2. The low cost (under $6, per sample) allows many samples to be run within a fixed budget, 3, The large number of elements seen in the average sample allows source identification by element to element to weather correlations. In addition, the samples are suitable for light element analysis by alpha scattering, for elements H through Cl, thus allowing an inventory to be made of all the aerosol mass in the atmosphere within the size range of the sampler.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 579 - 587
Copyright
Copyright © International Centre for Diffraction Data 1974

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Footnotes

*

Program supported by California Air Resources Board and NSF/RANN.

References

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