Hostname: page-component-745bb68f8f-l4dxg Total loading time: 0 Render date: 2025-02-05T00:51:34.648Z Has data issue: false hasContentIssue false
  • English
  • Français

Enhanced Range of Measurable Thickness of Thin Crystalline Layers Using θ/2θ Decoupled Powder X-ray Diffraction

Published online by Cambridge University Press:  06 March 2019

G. Kimmel  and
W. Kaplan
G. Kimmel
Affiliation:
Dept. of Materials Engineering Technion - Israel Institute of Technology Haifa, 32000 ISRAEL
W. Kaplan
Affiliation:
Dept. of Materials Engineering Technion - Israel Institute of Technology Haifa, 32000 ISRAEL
Get access

Extract

X-ray diffraction is one of the most useful methods for the characterisation of thin crystalline layers or coatings. The most interesting techniques are: the identification of phases and their relative quantities, texture analysis, and residual stress measurements.

Thin layers which are transparent to the x-ray beam (in the diffracted wavelength) yield different intensities as compared with a bulk sample.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 121 - 127
Copyright
Copyright © International Centre for Diffraction Data 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hejdov, H. and Cermak, M., “A New X-ray Diffraction Method for Thin Films Thickness Estimation”, Phys. Stat. Sol. 72:K95–K98 (1982).Google Scholar
2. Brandt, C. G. and van der Vliet, G. H., “Quantitative Analysis of Thin Samples by X-ray Diffraction”, Adv. X-ray Anal. 29:203–209 (1985).Google Scholar
3. Kimmel, G., Shafirstien, G., and Bamberger, M., “Fast Thickness Measurement of Thin Crystalline Layers By Relative Intensities XRPD Method, Adv. X-Ray Anal., 32:293–301 (1988).Google Scholar
4. Schreiner, W. N., Kimmel, G., “Observed and Calculated XRPD Intensities for Single Substance Specimens,” Adv. X-Ray Anal., 30:351–356 (1986).Google Scholar