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High Speed Characterization of Pseudomorphic Hemt Structures Using a Very Low Noise Scintillation Detector

Published online by Cambridge University Press:  06 March 2019

N. Loxley
Affiliation:
Bede Scientific Instruments, Lindsey Park, Bowburn, Durham DH6 5PF, U.K.
S. Cockerton
Affiliation:
Bede Scientific Instruments, Lindsey Park, Bowburn, Durham DH6 5PF, U.K.
B. K. Tanner
Affiliation:
Bede Scientific Instruments, Lindsey Park, Bowburn, Durham DH6 5PF, U.K.
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Abstract

We show that a very low noise, high dynamic range scintillation detector has major advantages over conventional detectors for characterization of pseudomorphic HEMT structures by high resolution X-ray diffraction. We show that the reduced background enables a second modulation period to be detected, enabling the thickness and composition to be determined independently. Using a conventional X-ray generator and diffractometer we demonstrate that, in a single scan taking only 10 seconds, we are able to obtain sufficiently good data to provide quality assurance.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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