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Location of Diffractometer Profiles in X-ray Stress Analysis

Published online by Cambridge University Press:  06 March 2019

D. Kirk  and
P. B. Caulfield
D. Kirk
Affiliation:
Larichester Polytechnic Coventry, England CV1 5FB
P. B. Caulfield
Affiliation:
Larichester Polytechnic Coventry, England CV1 5FB
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Abstract

The location of x-ray diffractometer line profiles is of fundamental importance in x-ray stress analysis. Objective estimates of the line profile position may be derived from diffractometer measurements at a number of equally-spaced points in the region of maximum intensity. These estimates are generally based upon the corresponding turning-point of a polynomial fitted to step-scanning data. Techniques are described which simplify the computation involved. A least-squares fitting of a quadratic is satisfactory for most routine applications provided that a reasonable number of points is involved. The three-point parabola method is less satisfactory. Expressions are presented, derived using the maximum-likelihood approach, for peak location and counting variance using both quadratic and cubic equations.

Type
X-Ray Diffraction Stress Analysis
Information
Advances in X-Ray Analysis , Volume 20: Twenty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-6, 1976 , 1976 , pp. 283 - 289
Copyright
Copyright © International Centre for Diffraction Data 1976

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References

1. Koistinen, D. P. and Marburger, R. E., “A Simplified Procedure for calculating Peak Position in X-Ray Residual Stress Measurements on Hardened Steel”, Trans, ASM, 51, 537–555, (1959).Google Scholar
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3. Kirk, D., “Experimental Features of Residual Stress Measurement by X-Ray Diffractometry”, Strain, 7, 7–14, 1971.Google Scholar