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A Low Cost Secondary Two Theta Standard for Powder Diffractometry

Published online by Cambridge University Press:  06 March 2019

David J. Stabb
David J. Stabb*
Affiliation:
Biological and Chemical Sciences Ballarat University College Ballarat, Australia
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Abstract

Silicon powder, available as a Standard Reference Material, fulfills most of the requirements for a two theta standard. However, It has no diffraction lines at the low 2θ values characteristic of some species. Standard synthetic mica is available but expensive.

Experiments with a commercially available high silica zeolite have shown that it is a valuable secondary standard. It is non-toxic, stable, inexpensive and possesses a large (24 Å) unit cell. Peaks show clearly from 14 Å (6°2θ for Cu Kα).

An example is given of the use of this secondary standard in determining lattice parameters.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 359 - 362
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Wong-Ng, W. and Hubbard, C.R., “Standard Reference Materials for X-ray Diffraction & Part II Calibration Using d-Spacing Standards”, 6, 2.1 in “Methods and Practices in X-ray Powder Diffraction”, JCPDS - International Centre for Diffraction Data, Swarthmore, (1989).Google Scholar
2. Gosselin, R.E., Smith, R.P., Hodge, H.C. and Braddock, J.E., “Clinical Toxicology of Commercial Products”, 5th edition, Williams and Wilkins, Baltimore/London, (1984).Google Scholar
3. Stabb, D.J., Powder Diffraction File No. 31-1607.Google Scholar