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Micro-Analysis by X-Ray Absorption, Fluorescence, Emission and Diffraction Using Ultra-Fine X-Ray Sources

Published online by Cambridge University Press:  06 March 2019

V. E. Cosslett
Affiliation:
Cambridge University, Cambridge, England
P. Duncumb
Affiliation:
Cambridge University, Cambridge, England
J. V. P. Long
Affiliation:
Cambridge University, Cambridge, England
W. G. Nixon
Affiliation:
Cambridge University, Cambridge, England
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Abstract

Fine focus X-ray tubes developed for projection X-ray microscopy can also be used for X-ray micro-analysis. Areas about 10 microns in diameter of thin sections have been analyzed by measuring differences in X-ray transmission, with particular reference to the determination of calcium in biological materials and in minerals. The high intensity of this X-ray point source has permitted micro-fluorescence analysis of similar small areas with high sensitivity and reasonable time. The same electron optical system has been used for micro-emission analysis of rock slices and mineral grains. By scanning the electron beam over the specimen surface and recording either the scattered electrons or the emitted X-rays, a two-dimensional picture can be displayed of the physical features or of the distribution of a particular element respectively. The analysis of a selected, volume of 1 cubic micron in the surface has been obtained by plotting the characteristic line emission spectrum with a crystal spectrometer and proportional counter. The sensitivity is 0. 1% or 10−1 gram. Micro-beam X-ray diffraction has also been used with a stationary X-ray source both for transmission and back reflection with a 10 minute exposure from a 10 micron diameter area.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1957

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