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Near-Surface Chemical Characterization Using Grazing Incidence X-ray Fluorescence

Published online by Cambridge University Press:  06 March 2019

Kenji Sakurai  and
Atsuo lida
Kenji Sakurai
Affiliation:
National Research Institute for Metals: 1-2-1, Sengen, Tsukuba, Ibaraki 305, Japan
Atsuo lida
Affiliation:
Photon Factory, National Laboratory for High Energy Physics: 1-1, Oho, Tsukuba, Ibaraki 305, Japan.
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Extract

External X-ray total reflection occurs when collimated X-ray beams impinge on a smooth, flat surface of matter at a small glancing angle, typically a few mrad. With respect to the X-ray fluorescence technique, total reflection experiments have allowed the trace determination of solution samples using an X-ray mirror as a sample support. The grazing incidence X-ray fluorescence technique (GIF) is also suitable for near-surface element analysis of the material, because the penetration depth of X-rays is 10-1000 Å around the critical angle.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 205 - 211
Copyright
Copyright © International Centre for Diffraction Data 1989

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