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New Features and Advanced Applications of Siroquant: A Personal Computer XRD Full Profile Quantitative Analysis Software Package

Published online by Cambridge University Press:  06 March 2019

J.C. Taylor  and
R.A. Clapp
J.C. Taylor
Affiliation:
CSIRO Division of Coal and Energy Technology Lucas Heights Research Laboratories PMB 7, Menai NSW 2234 Australia
R.A. Clapp
Affiliation:
CSIRO Division of Coal and Energy Technology Lucas Heights Research Laboratories PMB 7, Menai NSW 2234 Australia
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Abstract

SIROQUANT is a suite of personal ccmputer programs which runs on an IBM-compatible 386 or 486 personal computer, and gives phase quantification of mineral samples hy Rietveld refinement using the full XRD profile. Eight phases can be quantified in a mineral with the 640 K RAM version and 11 in the EM version.

New features have been added since the original description was written (J.C. Taylor, Powder Diffraction, 6, 2, 1991) including calculations of amorphous percentages using spiked samples, particle size calculations, use of “measured” as well as calculated patterns as standards, pre-programmed refinement “Stages” with different variables in each stage, and improved menus.

Some advanced applications of the system using these new features are described.

Type
I. Whole Pattern Fitting, Rietveld Analysis and Calculated Diffraction Patterns
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 49 - 55
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Taylor, J.C., Powder Diffraction, 6: 2–9 (1991).Google Scholar
2. Rietveld, H.M., J. Appl. Cryst., 2: 65–71 (1969).Google Scholar
3. Toraya, H., Marumo, F. and Yamase, T., Acta Cryst., B40; 145–150 (1984).Google Scholar
4. Taylor, J.C., Zeit. f. Krist, 181: 151–160 (1987).Google Scholar
5. Brindley, G.W., Phil. Mag., 36: 347–369 (1945).Google Scholar
6. Taylor, J.C. and Matulis, C.E., J. Appl. Cryst., 24: 14–17 (1991).Google Scholar
7. Smith, D.K., Johnson, G.G., Scheible, A., Wims, A.M., Johnson, J.L. and Ullman, G., Powder Diffraction, 2: 73–77 (1987).Google Scholar