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On the X-Ray Diffraction Method of Measurement of Triaxial Stresses with Particular Reference to the Angle 2θo

Published online by Cambridge University Press:  06 March 2019

S. Torbaty ,
J.M. Sprauel ,
G. Maeder  and
P.H. Markho
S. Torbaty
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151 Boulevard de l'Hôpital, 75013 Paris, France
J.M. Sprauel
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151 Boulevard de l'Hôpital, 75013 Paris, France
G. Maeder
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151 Boulevard de l'Hôpital, 75013 Paris, France
P.H. Markho
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151 Boulevard de l'Hôpital, 75013 Paris, France
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Abstract

Certain machining processes (e.g. turning, grinding, …) lead to a splitting up and an opening out of the curve of 2θ ϕ ψ = f (sin2ψ). In order to determine the complete stress tensor, it is necessary in this case to use the Dölle-Cohen method but this requires the knowledge of the diffraction angle 2θo for the unstressed material. Such a material, however, is extremely difficult to obtain in practice and the method usually employed uses annealed powder for this measurement. In our study, we show that it is nevertheless possible to determine the angle 2θo on a specimen for which the curve of 2θ ϕ ψ = f (sin2ψ) does not open out. Applying the Dölle-Cohen method to turning of a medium carbon steel, we have been able to bring to the fore: (i) the presence of an opening out of the curve 2θ ϕ ψ = f (sin2ψ), for measurements made in the direction of lay, which is attributed to a shear stress σ23, and (ii) shear stress σ12 which causes a rotation of the stress distribution diagram σϕ = f(ϕ) in the plane of the specimen.

Type
V. X-Ray Stress Determination, Position Sensitive Detectors, Fatigue and Fracture Characterization
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 245 - 253
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

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