Hostname: page-component-745bb68f8f-v2bm5 Total loading time: 0 Render date: 2025-02-05T03:53:48.693Z Has data issue: false hasContentIssue false
  • English
  • Français

The Optimization of Step Size While Collecting a Digitized Diffraction Pattern at a Constant Total Scan Time

Published online by Cambridge University Press:  06 March 2019

John R. Burleson
John R. Burleson*
Affiliation:
Materials Analysis Laboratory AC Rochester Div., General Motors Corp. Flint, MI 48556
Get access

Extract

Given a limited amount of time for data collection, what parameters do you select to generate the highest quality x-ray diffraction pattern from an automated diffractometer? This paper addresses the major topic of diffractometer step size or its equivalent, chopper size, for instruments running in the continuous scanning mode. In general, step size and chopper size will be interchanged freely. A minor topic intertwined into the discussion will be the receiver slit width.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 305 - 311
Copyright
Copyright © International Centre for Diffraction Data 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)