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Parallel Beam and Focusing X-ray Powder Diffractometry

Published online by Cambridge University Press:  06 March 2019

W. Parrish  and
M. Hart
W. Parrish
Affiliation:
IBM Research Division Almaden Research Center 650 Harry Road San Jose, California 95120-6099
M. Hart
Affiliation:
Department of Physics The University Manchester, U.K. M13 9PL
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Abstract

Comparison of results using synchrotron radiation and X-ray tubes requires a knowledge of the fundamentally different profile shapes inherent in the methods. The varying asymmetric shapes and peak shifts in focusing geometry limit the accuracy and applications of the method and their origins are reviewed. Most o f the focusing aberrations such as specimen displacement, flat specimen and θ-2θ mis-setting do not occur in the parallel beam geometry. The X-ray optics used in synchrotron parallel beam methods produces narrow, symmetrical profiles which can be accurately fit with a pseudo-Voigt function, They have the same shape in the entire pattern. Only the width increases as tanθ due to wavelength dispersion but with higher resolution systems dispersion can be eliminated. The constant instrument function contribution to the experimental profile shape is an important advantage in studies involving profile shapes, e.g., small particle sizes and microstrains, and accurate integrated intensities. The absence of systematic errors leads to more precise lattice parameter determinations.

Type
VIII. Applications of Digitized XRD Patterns
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 481 - 488
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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