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Polarization of X-Rays by Scattering from the Interior of a Cylinder

I. Single Scatter

Published online by Cambridge University Press:  06 March 2019

John D. Zahrt  and
Richard Ryon
John D. Zahrt
Affiliation:
Chemistry Department, Northern Arizona University, Flagstaff, AZ
Richard Ryon
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA
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Extract

It is of interest today to use polarized X-rays in X-ray secondary fluorescence as a means of improving signal to noise ratios in the analysis of trace elements. Current experimental design makes use of two mutually perpendicular scatterings from plane parallel materials. Radiation with the electric field vector in the scattering plane (scattering angle = 90°) will be annihilated. Hence, after the mutually orthogonal, 90° scatterings no source X-rays should reach the detector. In practice source X-rays will only be greatly reduced at the detector due to such things as multiple scatter and collimator divergence. An experimental problem associated with this design however is the reduced intensity of the signal because of the scatterings with concomitant increase in analysis time.

Type
IX. Other XRF Applications
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 505 - 511
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. Ryon, Richard W., Adv. in X-Ray Anal. 20, 575–2 (1977).Google Scholar
2. Zahrt, John D. and Ryon, Richard W., Adv. in X-Ray Anal. 24, 345–2 (1981).Google Scholar
3. Zahrt, John D., unpublished manuscript.Google Scholar
4. Ryon, Richard W. and Zahrt, John D., Adv. in X-Ray Anal. 22, 453–2 (1979).Google Scholar
5. Zahrt, John D., Adv. in X-Ray Anal. 27 (following paper) (1983).Google Scholar
6. Chandrasekhar, S., “Radiative Transfer” (see particularly Chapter II), Dover, New York, 1960.Google Scholar