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A Position-Sensitive Proportinal Counter for Residual Stress Measurement by means of Microbeam X-Rays

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka ,
Kert-ichi Hasegawa  and
Koh-ichi Mochiki
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology 1, Tamazutsumi, Setagaya, Tokyo 158, Japan
Kert-ichi Hasegawa
Affiliation:
Dept, of Nuclear Engg., University of Tokyo 7, Hongoh, Bunkyo, Tokyo 113, Japan
Koh-ichi Mochiki
Affiliation:
Dept, of Nuclear Engg., University of Tokyo 7, Hongoh, Bunkyo, Tokyo 113, Japan
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Abstract

A position-sensitive proportional counter (PSPC) with high counting efficiency has been made for stress analysis with low intensity X-rays such as microbeam X-rays.

This PSPC system has made it possible to measure the residual stress in a small region such as a fatigue crack tip in very short time compared with the measurement by standard diffractometer or film methods.

Type
X-Ray Diffraction Stress (Strain) Determination
Information
Advances in X-Ray Analysis , Volume 23: Twenty-Eighth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1979 , 1979 , pp. 325 - 330
Copyright
Copyright © International Centre for Diffraction Data 1979

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References

1. Yoshioka, Y., Kaneko, T. and Terasawa, M., “Fatigue Crack Propagation and Residual Stress in Tufftrided Steel,” J. JSMS, 26:74 (1976).Google Scholar
2. Yoshioka, Y., Hasegawa, K. and Mochiki, K., “Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter,” Advances in X-Ray Analysis, 22:233 (1979).Google Scholar