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Practical and "Unusual" Applications in X-ray Diffraction Using Position Sensitive Detectors

Published online by Cambridge University Press:  06 March 2019

Ralph G. Tissot  and
Michael O. Eatough
Ralph G. Tissot
Affiliation:
Sandia National Laboratories Chemical Instrumentation Research Division Albuquerque, NM 87185
Michael O. Eatough
Affiliation:
Sandia National Laboratories Chemical Instrumentation Research Division Albuquerque, NM 87185
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Abstract

Position sensitive proportional counters (PSPCs) increase the scope of X-ray diffraction analyses. High pressure flow through type PSPCs can significantly reduce data collecting times due to She ability for simultaneous data collection over large two-theta ranges. This inherent characteristic allows the diffraction user broad capabilities such as scanning very rapidly over large two- theta ranges or collecting data in real time over shorter two-theta ranges without scanning. Thus, we have been able to perform detailed high- temperature experiments in relatively short time frames, observe phase transitions and reactions as they occur, and perform unusual experiments such as observing the crystallization of a plasma spray in-situ.

Type
VII. Solid State and Position-Sensitive Detectors for XRD
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 349 - 355
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

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