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Precision Lattice-Parameter Determination by Double-Scanning Diffractometry

Published online by Cambridge University Press:  06 March 2019

H. W. King  and
L. F. Vassamillet
H. W. King
Affiliation:
Mellon Institute, Pittsburgh, Pennsylvania
L. F. Vassamillet
Affiliation:
Mellon Institute, Pittsburgh, Pennsylvania
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Abstract

The availability of counter-tube diffractometers which can scan both sides of the direct beam makes it possible to locate the zero-angle position by comparing peak positions measured on either side of the beam. These diffractometers may thus be used to determine accurate lattice parameters without the need of a calibrating substance. The feasibility of this method is explored by determining the lattice parameters of pure silver, and the limits of accuracy are discussed.

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Type
Research Article
Information
Advances in X-Ray Analysis , Volume 5: Tenth Annual Conference on Applications of X-ray Analysis, August 7-9, 1961 , 1961 , pp. 78 - 85
Copyright
Copyright © International Centre for Diffraction Data 1961

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