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Proton-Induced X-Ray Emission Spectroscopy in Elemental Trace Analysis

Published online by Cambridge University Press:  06 March 2019

T.B. Johansson ,
R. Akselsson  and
S.A.E. Johansson
T.B. Johansson
Affiliation:
Department of Nuclear Physics Lund Institute of Technology, Lund, Sweden
R. Akselsson
Affiliation:
Department of Nuclear Physics Lund Institute of Technology, Lund, Sweden
S.A.E. Johansson
Affiliation:
Department of Nuclear Physics Lund Institute of Technology, Lund, Sweden
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Abstract

Using protons in the MeV range as excitation source and a high resolution Si(Li) detector, X-ray emission spectroscopy is shown to be capable of analysing many elements with Z > 15 simultaneously at the 10-12 g level, This work discusses a theoretical lower limit of detection at moderate proton energies and gives examples of possible applications: analysis of the elemental composition of air-borne particles as a function of particle size, oil slick identification, and analysis of water and blood serum.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 373 - 387
Copyright
Copyright © International Centre for Diffraction Data 1971

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References

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