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Quantitative XRF Analysis Using the Fundamental Algorithm

Published online by Cambridge University Press:  06 March 2019

Richard M. Rousseau
Richard M. Rousseau*
Affiliation:
Geological Survey of Canada601 Booth St., Ottawa, Ont., K1A 0E8, Canada
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Abstract

A modern theoretical method using the Fundamental Algorithm to correct for matrix effects in X-Ray Fluorescence (XRF) analysis is described. This powerful quantitative method combines the practical flexibility of influence coefficient concepts and the theoretical exactness of the fundamental parameter technique. This method is in full agreement with the treatment of the physics as proposed by Sherman and can be applied to the analysis of any sample types. It offers the maximum of accuracy limited only by the quality of sample preparation. The special calibration procedure associated with the Fundamental Algorithm is explained. This procedure allows the matching of theoretical formalism to experimental data of each individual laboratory. Finally and obviously, this approach requires a computer program to be applied. Some important guidelines are given to help XRF analysts to select the XRF program appropriate to their needs.

Type
IV. XRF Data Reduction
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 157 - 162
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

1. Lachance, G. R. and Traill, R. J., Can. Jour, of Spectrosc, 11, 43, (1966)Google Scholar
2. Criss, J. W. and Birks, L. S., Anal. Chem., 40, 1080, (1968)Google Scholar
3. Sherman, J., Spectrochim. Acta, 7, 283, (1955)Google Scholar
4. Rousseau, R. M., X-Ray Spectrometry, 13, 115 and 121, (1984).Google Scholar
5. Rousseau, R. M. and Bouchard, M., X-Ray Spectrometry, 15, 207, (1986)Google Scholar
6. Claisse, F. and Quintin, M., Can. Jour, of Spectrosc, 12, 129, (1967)Google Scholar
7. Rousseau, R. M. and Claisse, F., X-Ray Spectrometry, 3, 31, (1974)Google Scholar
8. Rousseau, R. M., Advances in X-Ray Analysis, 32, 69, (1989)Google Scholar
9. Pella, P. A., Feng, Liangyuan and Small, J. A., X-Ray Spectrometry, 14, 125, (1985)Google Scholar
10. Heinrich, K. F. J., 11th International Congress on X-Ray Optics and Microanalysis, London, Canada, August 1986.Google Scholar
11. Springer, G. and Nolan, B., Can. Jour. of Spectrosc., 21, 134, (1976)Google Scholar
12. Bambinek, W., Craseraann, B., Fink, R. W. and al., Reviews of Modern Physics, 44,716,(1972).Google Scholar
13. Hanke, W., Wemisch, J. and Pohn, C., X-Ray Spectrometry, 14, 43, (1985)Google Scholar
14. Schreiber, T. P. and Wims, A. M., X-Ray Spectrometry, 11, 42, (1982)Google Scholar
15. LES LOGIC1ELS R. ROUSSEAU INC., 28 Montmagny, B. P. 394, Cantley, Quebec, JOX ILO, Canada.Google Scholar
16. Bilbrey, D. B., Bogart, G. R., Leyden, D. E., Harding, A. R., X-Ray Spectrometry, 17, 63, (1988)Google Scholar