Hostname: page-component-745bb68f8f-cphqk Total loading time: 0 Render date: 2025-01-15T06:10:30.352Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Xrfa of Carbon in a Special Matrix by the Fundamental Parameter Method

Published online by Cambridge University Press:  06 March 2019

Franz A. Weber ,
Luiz. B. Da Silva ,
Troy W. Barbee Jr. ,
Dino Ciarlo  and
Michael Mantler
Franz A. Weber
Affiliation:
University of California, Lawrence Liverraore National Laboratory, P.O. Box 808, Livermore, CA 94551, USA
Luiz. B. Da Silva
Affiliation:
University of California, Lawrence Liverraore National Laboratory, P.O. Box 808, Livermore, CA 94551, USA
Troy W. Barbee Jr.
Affiliation:
University of California, Lawrence Liverraore National Laboratory, P.O. Box 808, Livermore, CA 94551, USA
Dino Ciarlo
Affiliation:
University of California, Lawrence Liverraore National Laboratory, P.O. Box 808, Livermore, CA 94551, USA
Michael Mantler
Affiliation:
Institute of Applied and Technical Physics Technical University Vienna, A-1040 Vienna, Austria
Get access

Summary

We report on results obtained from experiments using specially prepared carbon substrates and treatment of the data by means of recently introduced theory. Medium Z grids with known parameters have been coated on top of pyrolytic carbon substrates to achieve well defined absorption geometries. The various copper grids exhibit satisfactory performance in terms of mechanical stability, homogeneity and uniformity of the coating. A detailed study of the measurement results shows that there is a more rapid increase of the associated C-Kα countrate from the coated samples compared to the pure elements and is attributed to the contribution of secondary enhancement effects, including those resulting from photoelectrons generated after the primary ionization.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 821 - 829
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Mantler, M.: Advances in X-ray Analysis 36, 27 (1993).Google Scholar
2. Sherman, J.: Spectrochim. Acta 7, 283 (1955).Google Scholar
3. Broll, N., Canssin, P., and Peter, M.: X-ray Spectrom. 21 (43)Google Scholar
4. Shiraiwa, T., and Fujino, N.: Jpn J. Appl. Phys. 5 (886)Google Scholar
5. Arai, T., Shoji, T., and Omote, K.: Advances in X-ray Analysis 29, 413 (1986).Google Scholar
6. Green, M. and Cosslett, V. E.: Proc. Phys. Soc. 78 (1206)Google Scholar
7. Weber, F.: Dissertation and citations therein, Technische Universität Wien (1993).Google Scholar
8. Stoev, K. N.: J. Phys. D: Appl. Phys. 25, 131 (1992).Google Scholar
9. Weber, F., Mantier, M. and Wariwoda, L.: Advances in X-ray Analysis 36, 41 (1993).Google Scholar
10. Henke, B. L., Lee, P., Tanaka, T. J., Shimbabukuro, R. L., and Fujikawa, B. K.: Atomic Data and Nucl. Data Tables 27 (1), 27 (1982).Google Scholar
11. Bearden, J. A., and Thomsen, J. S.: AIP Handbook (Gray, D. E., ed. ), 7-96, McGraw Hill (1972).Google Scholar
12. Kaufmann, M., Manfier, M., Weber, F.: Advances in X-ray Analysis 37, 205–212 (1994).Google Scholar