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Recent Developments and Results in Total Reflection X-ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

Peter Wobrauschek ,
Peter Kregsamer ,
Christina Streli  and
Hannes Aiginger
Peter Wobrauschek
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Peter Kregsamer
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Christina Streli
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
Hannes Aiginger
Affiliation:
Atominstitut der Osterreichischen Universitäten Schüttelstraße 115, A-1020 Wien, Austria
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Abstract

In the last years Total Reflection X-Ray Fluorescence spectroscopy (TXRF) has shown to be an analytical technique for trace element analysis as well as surface quality control. Detection limits in the range of pg or ng/g (ppb) level in concentration values of aqueous solutions or 1011 -109 atoms/cm2 are achieved with new excitation sources. The range of detectable elements has been extended to low and high 2 elements. Instrumental developments and results of the Atominstitut as well as from some other working groups are presented.

Type
I. Surface and Near-Surface X-Ray Spectroscopy
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 1 - 12
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

1. Yoneda, Y. and Horiuchi, T., Rev. Sci. Inscr. 42, 1069 (1971).Google Scholar
2. Aiginger, H. and Wobrauschek, P., Nucl. Instr. Meth. 114, 157 (1974).Google Scholar
3. Wobrauschek, P. and Aiginger, H., Anal. Chem. 47, 852 (1975).Google Scholar
4. Wobrauschek, P. and Aiginger, H., Spectrochim. Acta 35 B, 607 (1980).Google Scholar
5. Wobrauschek, P. and Aiginger, H., X-Ray Spectrom. 8, 57 (1979).Google Scholar
6. Knoth, J. and Schwenke, H., Fresenius Z. Anal. Chem. 291, 200 (1978).Google Scholar
7. Knoth, J. and Schwenke, H., Fresenius Z. Anal.Chem. 301, 7 (1980).Google Scholar
8. Schwenke, H., Berneike, W., Knoth, J. and Weisbrod, U., Adv. X-Ray Anal. 32, 105 (1989).Google Scholar
9. Prange, A., Adv. X-Ray Anal. 32, 211 (1989).Google Scholar
10. Wobrauschek, P., Kregsamer, P., Streli, C. and Aiginger, H., accepted for publication in X-Ray Spectrometry.Google Scholar
11. Iida, A., Yoshinaga, A., Sakurai, K. and Gohshi, Y., Anal. Chem. 58, 394 (1986).Google Scholar
12. Iida, A., Sakurai, K., Yoshinaga, A. and Gohshi, Y., Nucl.Inst.Meth. A246, 736 (1986).Google Scholar
13. Knoth, J., Schwenke, H. and Weisbrod, U., Spectrochim.Acta 44B, 477 (1989).Google Scholar
14. Penka, V. and Hub, W., Spectrochim. Acta 44 B, 483 (1989).Google Scholar
15. Penka, V. and Hub, W., Fresenius Z. Anal. Chem. 333, 586 (1989).Google Scholar
16. Berneike, W., Knoth, J., Schwenke, H. and Weisbrod, U., Fresenius Z. Anal. Chem. 333, 524 (1989).Google Scholar
17. Schnabel, E., Hosemann, R. and Röde, B., J. Appl. Phys. 43, 3227 (1972).Google Scholar
18. Schwenke, H. and Knoth, J., Nucl. Instr. Meth. 193, 239 (1982).Google Scholar
19. Aiginger, H. and Wobrauschek, P., Adv. X-Ray Anal. 28, 1 (1985).Google Scholar
20. Rindby, A., Nucl. Inst. Meth. A249, 536 (1986).Google Scholar
21. Stern, E., Kalman, Z., Lewis, A. and Liebermann, K., Appl. Opt. 27, 5135 (1988).Google Scholar
22. Carpenter, A., X-Ray Spectr. 18, 253 (1989).Google Scholar
23. Larsson, S., Engström, F. and Rindby, A., Adv.X-Ray Anal. 33, 623 (1990).Google Scholar
24. Klockenkämper, R., Spectroscopy International 2, 26 (1990).Google Scholar
25. Nishihagi, K., Fujino, N., Taniguchi, T. and Ikeda, S., 39th Denver X-Ray Conference, Steamboat Springs 1990, oral presentation.Google Scholar
26. Pella, P. and Dobbyn, R., Anal. Chem. 60, 684 (1988).Google Scholar
27. Wobrauschek, P. and Kregsamer, P., Spectrochim. Acta 44 B, 453 (1989).Google Scholar
28. Streli, C., Aiginger, H. and Wobrauschek, P., Spectrochim. Acta 44 B, 491 (1989).Google Scholar
29. Aiginger, H., Wobrauschek, P. and Brauner, C., Nucl. Instr. Meth. 120, 541 (1974).Google Scholar
30. Wobrauschek, P. and Aiginger, H., Adv. X-Ray Anal. 28, 69 (1985).Google Scholar
31. Ryon, R. and Zahrt, J., Handbook on X-Ray Spectroscopy, Marcel Dekker, to be published.Google Scholar
32. Nomura, S., Nishihagi, K. and Taniguchi, K. Adv. X-Ray Anal., 32, 205 (1989).Google Scholar
33. Saisho, H., Trends Anal. Chem. 8, 209 (1989).Google Scholar
34. Iida, A., Sakurai, K. and Gohshi, Y., Adv. X-Ray Anal. 31, 487 (1988).Google Scholar
35. Schwenke, H., EDXRF workshop, Antwerpen 1990, oral presentation.Google Scholar
36. Schuster, M., Spectrochim.Act., to be published.Google Scholar
37. Schuster, M., Adv. X-Ray Anal., to be published in same Vol.Google Scholar
38. de Boer, D., Spectrochim. Acta, to be published.Google Scholar
39. de Boer, D., Adv. X-Ray Anal., to be published.Google Scholar
40. EXTRA II , Rich.Seifert & Co., 2070 Ahrensburg, FRG.Google Scholar
41. XSA 8000, Atomica Perkin Elmer, 8042 Qberschleifiheim, FRG.Google Scholar
42. TREX 610, Technos, Neyagawa City, Osaka 572, Japan.Google Scholar