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Spectra of X-Ray Tubes with Transmission Anodes for Fundamental Parameter Analysis

Published online by Cambridge University Press:  06 March 2019

Horst Ebel ,
Maria F. Ebel ,
Christian Pöhn  and
Bernd Schoßmann
Horst Ebel
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraße 8-10 A 1040 Wien, Austria
Maria F. Ebel
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraße 8-10 A 1040 Wien, Austria
Christian Pöhn
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraße 8-10 A 1040 Wien, Austria
Bernd Schoßmann
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraße 8-10 A 1040 Wien, Austria
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Abstract

The approach for the description of the emission of white and characteristic x-rays from standard x-ray tubes is modified for an application to transmission anodes. This modification is based on the assumption of a negligible penetration depth of the electrons in comparison to the thickness of the anode. The results of our considerations are presented for Cu, Mo and W anodes with two different thicknesses. For comparison, the spectra of standard anodes which have been operated with identically high voltages and anode currents are given. A typical feature of transmission anodes is their spectral hardening of the energy distribution of emitted photons. A further interesting detail is the development of narrow band excitation anodes as can be seen from the results for Mo. With anode thicknesses of approximately 200 μm and a high voltage of 30 kv the spectral distribution is restricted to an energy ranging from 15 to 20 keV.

Type
III. XRS Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 81 - 88
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

1 Pella, P.A., Feng, L. Y. and Small, J. A., X-Ray Spectrometry 14, 125 (1985)Google Scholar
2 Ebel, H., Wiederschwinger, H., Wernisch, J. and Pella, P., Adv. X-Ray Anal. 35 (1992) 721 Google Scholar
3 Smith, D.G.W., Gold, C. M. and Tomlinson, D. A., X-Ray Spectrometry 4, 149 (1975)Google Scholar
4 Love, G. and Scott, V. D., J.Phys.D:Appl.Phys. 11, 1369 (1978), J.Phys.D:Appl.Phys. 13, 995 (1980), Scanning 4, 111 (1981)Google Scholar
5 Bloch, F., Z.Phys. 81, 363 (1933)Google Scholar
6 Hunger, H.J. and Küchler, L., Phys.Status Solidi (a)56, K45 (1979)Google Scholar
7 McMaster, W.H., del Grande, N. K., Mallett, J. H. and Hubbell, J. H., Compilation of X-Ray Cross-Sections, UCRL-50174, Sect.II, Rev.l. Lawrence Radiation Laboratory, University of California, Livermore, CA (1969)Google Scholar
8 Mott, N.F. and Massey, H.S.W., The Theory of Atomic Collisions, Oxford University Press, London (1949)Google Scholar
9 August, H.J., Razka, R. and Wernisch, J., Scanning 10, 107 (1988)Google Scholar
10 Pöhn, Ch., Wernisch, J. and Hanke, W., X-Ray Spectrometry 14, 120 (1985)Google Scholar