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Standardless Thickness Measurement of Steel Coatings by X-Ray Fluorescence Spectrometry

Published online by Cambridge University Press:  06 March 2019

Katsumi Ohno
Katsumi Ohno*
Affiliation:
National Research Institute for Metals, Tokyo, Japan
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Because the cost of the large number of standards required for quantitative X-ray fluorescence analysis is prohibitive, a mathematical procedure, the “fundamental parameters method” is gaining popularity. A major problem in using the method is the limited knowledge of the spectral distribution of the primary radiation from the X-ray tube, the need for a large computer memory which makes it difficult to use with minicomputers and uncertainties in the basic parameters. A monochromatic X-ray source was developed to avoid the problem of the spectral distribution. This permitted simple calculations for the calibration and a simple algorithm to transform the intensities to mass fraction or coating thickness. The calculations were made with a slide rule calculator.

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Advances in X-Ray Analysis , Volume 21: Twenty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-5, 1977 , 1977 , pp. 89 - 92
Copyright
Copyright © International Centre for Diffraction Data 1977

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References

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