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Structural Characterization of Magnetic Recording Media by Using Grazing Incident and Conventional X-Ray Diffraction

Published online by Cambridge University Press:  06 March 2019

Po-Wen Wang
Po-Wen Wang*
Affiliation:
IBM E28A/502 5600 Cottle Rd. San Jose, Ca. 95193
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Extract

In recent years, the microstructure of Co-based alloy magnetic thin film disks has been studied extensively by using a conventional x-ray diffraction (XRD) technique(1-4). Efforts to understand the relationship between the microstructure and the magnetic properties of disk had been limited due to the lack of depth resolution in the conventional theta-2theta scanning technique. In this paper, a fixed 0.5 degree of grazing incidence(5) 2-theta scan X-ray diffraction (GIXRD) technique was used to characterize the thin film disk microstructure and therefore to correlate with the magnetic properties.

Type
V. X-Ray Characterization of Thin Films
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 197 - 202
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

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