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Thickness Gauging of Organic Films on Large Plastic Body Parts With an Xrf Probe Based on a Roomtemperature Mercuric Iodide Detector

Published online by Cambridge University Press:  06 March 2019

Pierre F. Buckens ,
Jan S. Iwanczyk ,
Yuzhong J. Wang  and
Richard S. Marano
Pierre F. Buckens
Affiliation:
Xsirius Inc. 1220 Avenida Acaso, Camarillo, CA 93012
Jan S. Iwanczyk
Affiliation:
Xsirius Inc. 1220 Avenida Acaso, Camarillo, CA 93012
Yuzhong J. Wang
Affiliation:
Xsirius Inc. 1220 Avenida Acaso, Camarillo, CA 93012
Richard S. Marano
Affiliation:
Ford Motor Company 20000 Rotunda Drive, Dearborn, MI 48124
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Abstract

The variability of adhesion promoter (primer) film thickness has been identified at Ford Motor Company as an important factor in maintaining the quality of paint on exterior plastic body parts. XRF offers unique advantages for non-destructive film monitoring. Monitoring of large parts for process control requires a non-contact approach using a small mobile probe. Previous attempts to implement a practical XRF gauging probe have been hampered by the choice of available x-ray detection technologies; proportional counters cannot resolve the layer's fluorescent lines properly and suffer from instability, while Si(Li) or Ge detectors need cooling to low temperatures, which makes their usage impractical for mobile probe.

The recent commercial availability of state-of-the-art Mercuric Iodide (HgI2) x-ray detectors led to the development of a lightweight XRF probe that contains an x-ray tube and a HgI2 detector. Thickness measurements of primer films on plastic substrates were characterized, and 15 sec. acquisition yielded precision of 0.225 and 0.525 pm for film thicknesses of 5 and 20 µm respectively. Ti was added to the substrate and Cr to the film as tagging elements. A ratiometric technique, taking into account absorption of the Ti signal in the film, yields excellent linearity and compensates for instrumental errors such as sampleto- probe distance variation and x-ray source fluctuations.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 395 - 404
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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