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Total Reflectance X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

Hannes Aiginger  and
Peter Wobrauschek
Hannes Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
Peter Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
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Abstract

The reduction of the background in x-ray fluorescent spectra is achieved by total reflection of the primary x-rays at a plane, smooth surface of a suitable reflector material. This effect essentially reduces the background caused by scattering of the primary photons from the substrate, thus improving the lower limits of detection in x-ray fluorescence analysis (XRF). Introducing additional to the reflector-substrate another reflector in the primary beam, this affects the spectral distribution of the exciting radiation (“high energy cutoff”). The result is an improved background, where detection limits of picogram amounts or concentrations in the ppb range are attainable for medium Z elements with energy dispersive detectors.

Type
I. The Role of X-Ray Fluorescence in a Modern Analytical Laboratory (Plenary Session Papers)
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 1 - 10
Copyright
Copyright © International Centre for Diffraction Data 1984

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