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Total Reflection Xrf of Light Elements Using Various Excitation Sources

Published online by Cambridge University Press:  06 March 2019

Christina Streli ,
P. Wobrauschek ,
H. Aiginger ,
W. Ladisich  and
R. Rieder
Christina Streli
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
P. Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
H. Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
W. Ladisich
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
R. Rieder
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraβe 115, A-1020 Wien, Austria
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Abstract

Total Reflection X-Ray Fluorescence Analysis (TXRF) has been proved to be well suited for the energy dispersive analysis of light elements using a special spectrometer, which is equipped with an energy dispersive detector having all properties for the detection of low energy radiation. The detection of the light elements is strongly influenced by the excitation source which should provide a large number of photons with energies near the K-absorption edge of these elements (0.2 - 3 keV). Various standard tubes with Be-window as well as a homemade windowless tube are compared, all differing in focal size, total power and anode material. Optimized excitation conditions are provided by synchrotron radiation meeting all requirements for excellent excitation of light elements in total reflection geometry such as high brilliance and ideal spectral distribution specially in the low energy region. A comparison of excitation with X-ray tubes as well as with synchrotron radiation is shown. Detection limits of 200 fg for Mg have been obtained with synchrotron radiation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 577 - 583
Copyright
Copyright © International Centre for Diffraction Data 1993

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