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Trace Analytical Capabilities of Total-Reflection X-ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

W. Michaelis ,
J. Knoth ,
A. Prange  and
H. Schwenke
W. Michaelis
Affiliation:
Institute of Physics, GKSS-Research Centre D-2054 Geesthacht, Federal Republic of Germany
J. Knoth
Affiliation:
Institute of Physics, GKSS-Research Centre D-2054 Geesthacht, Federal Republic of Germany
A. Prange
Affiliation:
Institute of Physics, GKSS-Research Centre D-2054 Geesthacht, Federal Republic of Germany
H. Schwenke
Affiliation:
Institute of Physics, GKSS-Research Centre D-2054 Geesthacht, Federal Republic of Germany
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Abstract

The principle to utilize total reflection of the primary X-rays in fluorescence analysis is known since a lot of years. Nevertheless, analytical chemistry did not profit from the inherent advantages of the method for a long time. The main reason for this failure was the lack of instruments which were easy to use in practice. A few years ago, however, the development of a proper mechanical design and of adapted sample preparation techniques led to commercially available spectrometers which throughout fulfill the demands for routine applications. Since then the utilization of Total-Reflection X-Ray Fluorescence Analysis (TXRF) has increased rapidly. The scope of work is meanwhile widespread over environmental research and monitoring, mineralogy, mineral exploration, oceanography, biology, medicine and biochemistry. Accordingly, numerous matrices have been handled.

Type
III. New Techniques and Instrumentation in XRF
Information
Advances in X-Ray Analysis , Volume 28: Thirty-Third Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1984 , 1984 , pp. 75 - 83
Copyright
Copyright © International Centre for Diffraction Data 1984

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