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Trace Element Analysis by Synchrotron Radiation Excited XRF

Published online by Cambridge University Press:  06 March 2019

S.T. Davies ,
D.K. Bowen ,
M. Prins  and
A.J.J. Bos
S.T. Davies
Affiliation:
University of Warwick
D.K. Bowen
Affiliation:
University of Warwick Daresbury Laboratory,U.K.
M. Prins
Affiliation:
Technische Hogeschool Eindhoven
A.J.J. Bos
Affiliation:
Vrije Universiteit, Amsterdam, The Netherlands
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Extract

The ability rapidly and quantitatively to detect trace elements in a host matrix is of great importance in many areas of science and engineering. This fact is underlined by the considerable amount of effort that has been put into developing such techniques as electron probe microanalysis, proton Induced x-ray emission (Pixe), the laser microprobe mass analyser (Lamma) as well as conventional x-ray fluorescence methods. Recently the availability of electron storage rings partially or wholly dedicated to producing intense beams of synchrotron radiation has provided a new tpol to complement the above mentioned techniques. This paper reports on work at Daresbury Laboratory on synchrotron x-ray fluorescence (SXRF) fo r quantitative trace element analysis.

Type
IX. Other XRF Applications
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 557 - 562
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. Sparks, C. J.. Jr., in Synchrotron Radiation Research, edited by Wtnick, H. and Donlach, S. (Plenum Press, New York) p. 459, (1980).Google Scholar
2. Currie, L. A., Anal, Chem., 40, 586 (1968).Google Scholar
3. Bos, A. J. J., Vis, R. D., Prins, M., Davies, S. T., Bowen, D. K., Makjanic, J. and Valkovic, V., Nuc.Inst. and Methods, (in press).Google Scholar
4. Prins, M., Van der Heide, J. A., Bos, A. J. J., Bowen, D. K., and Davies, S. T., I. E. E. E., Trans. Nuc. Sci., NS-3 0 (2), 1243 (1983).Google Scholar
6. Gilfrich, J.V., Skelton, E. F., Quadri, S. B., Kirkland, J. P. and Nagel, D. J., Anal. Chem., 55, 187(1983).Google Scholar
7. Knochel, A., Petersen, W. and Tolkiehn, G., Nucl. Instr. and Methods 208, 659 (1983).Google Scholar
8. Bowen, D.K. and Davies, S. T. (to be published).Google Scholar