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The Use of 2-D Detector Utilizing Laser-Stimulated Luminescence for X-ray Diffraction Studies on Mechanical Behaviour of Materials

Published online by Cambridge University Press:  06 March 2019

Y. Yoshioka ,
T. Shinkai  and
S. Ohya
Y. Yoshioka
Affiliation:
Musachi Institute of Technology 1-28 Tamazutsumi, Setagaya, Tokyo 158, Japan
T. Shinkai
Affiliation:
Musachi Institute of Technology 1-28 Tamazutsumi, Setagaya, Tokyo 158, Japan
S. Ohya
Affiliation:
Musachi Institute of Technology 1-28 Tamazutsumi, Setagaya, Tokyo 158, Japan
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Extract

The development of linear position-sensitive detectors (PSD) has resulted in a large reduction of data acquisition times in the field of x-ray stress analysis. However, we also require two-dimensional (2-D) diffraction patterns for material evaluation. Especially, the microbeam x-ray diffraction technique gives valuable information on the structure of crystalline materials and this technique has been applied to fracture analysis by x-rays. Many kinds of 2-D PSD have been developed that have insufficient spatial resolution. So x-ray film has still been used as a 2-D detector, but it requires relatively long exposure times and then the process after exposure is very troublesome.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 389 - 396
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

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