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Use of Calculated Alpha-Coefficients in Quantitative X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

R. Jenkins ,
J.F. Croke ,
R.L. Niemann  and
R. G. Westberg
R. Jenkins
Affiliation:
Philips Electronic Instruments, Inc., Mount Vernon, New York 10550
J.F. Croke
Affiliation:
Philips Electronic Instruments, Inc., Mount Vernon, New York 10550
R.L. Niemann
Affiliation:
Philips Electronic Instruments, Inc., Mount Vernon, New York 10550
R. G. Westberg
Affiliation:
Philips Electronic Instruments, Inc., Mount Vernon, New York 10550
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Extract

At the present stage of development of mathematical correction procedures, the so-called empirical methods are well established and reasonably reliable, require relatively small computers for their application, but require large numbers of calibration standards for the determination of the (alpha) correction constants. On the other hand, the so-called fundamental methods are less well proven and require more sophisticated computing facilities. One possible means of achieving the advantages of both techniques is to use a large computer to calculate the alpha coefficients from fundamental constants, then to use a small online computer for their application in an "empirical type" algorithm. de Jongh has proposed such a program called "ALPHAS" for the calculation of interelement correction constants and the present paper elaborates on this approach using as examples data collected in our own laboratory during the past year or so.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 372 - 381
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

1. de Jongh, W.K., X-Ray Spectrom., 2, 151 (1973)Google Scholar
2. Jenkins, R., “An Introduction to X-Ray Spectrometry”, Chapter 7, Heyden :London (1974).Google Scholar
3. Rasberry, S.D., and Heinrich, K.F.J, Anal. Chem., 46, 81 (1974).Google Scholar
4. Criss, J.W. and Birks, L.S., Anal. Chem., 40, 1080 (1968)Google Scholar
5. Lachance, G. R., and Traill, R.J., Can. Spectry., 11, 43 (1966)Google Scholar
6. Lucas Tooth, H.J., and Pyne, C., Advances in X-Ray Analysis, 7, 523 (1964)Google Scholar
7. Claisse, F., and Quintin, M., Can. Spectry., 12, 129, (1967)Google Scholar
8. Rousseau, R., and Claisse, F., X-Ray Spectrom., 3, 31 (1974)Google Scholar