Hostname: page-component-745bb68f8f-d8cs5 Total loading time: 0 Render date: 2025-01-14T12:34:31.428Z Has data issue: false hasContentIssue false
  • English
  • Français

Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

Published online by Cambridge University Press:  06 March 2019

Tom O'Reilly  and
Bi-Shia W. King
Tom O'Reilly
Affiliation:
Kevex Corporation, Foster City, CA
Bi-Shia W. King
Affiliation:
U.S. Geological Survey, Menlo Park, CA
Get access

Abstract

A new fundamental-parameter program has been developed which corrects for light element absorption based on the mean atomic number of the sample. The mean atomic number, in turn, is determined from the Compton/Rayleigh scatter intensity ratio. The program is quite flexible with regard to the number and the type of standards which may be used. The accuracy and precision of the method has been evaluated with several geological and biological standards. The results are in good agreement with those obtained by some other methods (CEMAS, XRF-11).

Type
III. XRF Fundamental Parameters and Data Analysis
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 165 - 174
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Andermann, G. and Kemp, J.W., “Scattered X-Rays as internal standards in X-Ray emission spectroscopy”, Anal. Chem. 30: 1306-1309 (1958).Google Scholar
2. Nielson, Kirk K., “Multielement analysis of unweighed biological and geological samples using backscatter and fundamental parameters”, Advances in X-Ray Analysis, 26: 385-390 (1983).Google Scholar
3. Van Dyck, Peter M. and Van Grieken, Rene E., “Absorption correction via scattered radiation in energy-dispersive X-ray fluorescence analysis for samples of variable compostion and thickness”, Anal. Chem., 52: 1859-1864 (1980).Google Scholar
4. Otvos, J.W., Wyld, G. and Yao, T.C., “Fundamental paradetar method for quantitative elemental analysis with monochromatic X-ray sources” (1976).Google Scholar
5. Gedke, D.A., et al. “FPT: An integrated fundamental parameters program for broadband EDXRF. Analysis without a set of similar standards.“ Advances in X-Ray Analysis, 26: 355-368 (1982).Google Scholar
6. Sparks, C.J. “Quantitative X-Ray fluorescent analysis using fundamental parameters”, Advances in X-Ray Analysis, 19: 19-51 (1972).Google Scholar
7. Kunzendorf, H., “Quick determination of the average atomic number by X-Ray scattering”, Nuclear Instruments and Methods, 99: 611-612 (1972).Google Scholar
8. Criss, J.W., “Fundamental-parameters calculations on a laboratory microcomputer”, Adv. X-ray Anal. 23: 93-97 (1980).Google Scholar