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X-Ray Analysis of Stress in a Localized Area by Use of Imaging Plate

Published online by Cambridge University Press:  06 March 2019

Yasuo Yoshioka  and
Shin'ichi Ohya
Yasuo Yoshioka
Affiliation:
Musashi Institute of Technology 1-28 Tamazutsumi, Setagaya Tokyo 158, Japan
Shin'ichi Ohya
Affiliation:
Musashi Institute of Technology 1-28 Tamazutsumi, Setagaya Tokyo 158, Japan
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Abstract

For determination of stress in a localized area, we combined a modified single exposure technique and the imaging plate, which is an x-ray digital area detector. With the, single exposure method, stress value is obtained from lattice strains in two directions with a single incident x-ray beam directed at an oblique angle. However, since diffraction data around a whole Debye-Scherrer ring was used in this study, a stress value can be accurately determined in comparison with the single exposure method. We observed the DS ring by use of the imaging plate with requiring only a short exposure time. Lattice strains in many directions on a DS ring were measured by an image analyzer connected to a computer; we verified the effectiveness of this method.

Type
VII. Stress Determination by Diffraction Methods
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 537 - 543
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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