Hostname: page-component-745bb68f8f-f46jp Total loading time: 0 Render date: 2025-01-14T12:03:31.420Z Has data issue: false hasContentIssue false
  • English
  • Français

X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films

Published online by Cambridge University Press:  06 March 2019

A. C. Vermeulen ,
R. Delhez ,
Th.H. de Keijser  and
E. J. Mittemeijer
A. C. Vermeulen
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
R. Delhez
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
Th.H. de Keijser
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
E. J. Mittemeijer
Affiliation:
Laboratory of Materials Science, Delft University of Technology, Rotterdamseweg 137, 2628 AL Delft, The Netherlands
Get access

Extract

A method has heen developed to determine the dislocation configuration in a polycrystalline specimen from the direction dependence of line broadening. The method is based on an analytical expression for the integral breadth due to microstrain from sets of parallel edge and/or screw dislocations on the specific slip systems. Analysis of the x-ray-diffraction measurements obtained from poly crystalline aluminium layers, deposited onto silicon wafers and subsequently annealed and cooled to room temperature, shows unequal densities and unequal changes of densities of dislocations with the Burgers vector parallel and with the Burgers vector inclined with respect to the surface of the layer. Stress relaxation and dislocation annihilation occur at room temperature. A model was developed to describe the dependency of the decrease of macrostress on the decrease of the dislocation density.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 195 - 210
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hauk, V. M. and Macherauch, E. in: Adv. in X-ray Anal. (Eds. Cohen, J. B. et al. ) 27 (1983), 81.Google Scholar
2. Noyan, I. C. and Cohen, J. B., Residual Stress; measurement by diffraction and interpretation, Springer Verlag, New York, 1987.Google Scholar
3. Delhez, R., de Keijser, Th. H. and Mittemeijer, E. J., Fres. Z. Anal. Chem. 312 (1982), 1.Google Scholar
4. Proceedings of the First, Second and Third European Powder Diffraction Conferences (Eds. Delhez, R. and Mittemeijer, E. J.), Mat. Sci. Forum, 79-82 (1991); Mat. Sci. Forum, 133-136 (1993) and Mat. Sci. Forum, 166-169 (1994).Google Scholar
5. Vermeulen, A. C., Delhez, R., de Keijser, Th. H. and Mittemeijer, E. J., J. Appl. Phys. 77 (1995), 5026.Google Scholar
6. Delhez, R., de Keijser, Th. H. and Mittemeijer, E. J., Surf. Eng. 3 (1987), 331.Google Scholar
7. Korhonen, M. A. and Paszkiet, C. A., Scr. Metall. 23 (1989), 1449.Google Scholar
8. Kooi, B. J., Sloof, W. G., Somers, M. A. J., Vermeulen, A. C., Delhez, R., de Keijser, Th. H. and Mittemeijer, E. J. in: Proc. Int. Conf. on Residual Stresses III (Eds. Fujiwara, H. et al. ), Elsevier Applied Science, London, 1992, p. 11.Google Scholar
9. Bunge, H. J., Texture Analysis in Materials Science; mathematical methods, Butter worths, London, 1982.Google Scholar
10. Williamson, G. K. and Smallman, R. E., Phil, Mag. 1 (1956), 34.Google Scholar
11. Krivoglaz, M. A. and Ryaboshapka, K. P., Fiz. Metal. Metalloved. , 15 (1963), 18 [Phys. Met. Metallogr. (USSR) 15 (1963), 14].Google Scholar
12. Wilkens, M., Acta Metall. 17(1969), 1155 (in German).Google Scholar
13. Wilkens, M., Fundamental Aspects of Dislocation Theory, NBS (now NIST) Special Publication No. 317, II, edited by Simmons, J. A., de Wit, R. and Bullough, R. (US Department of Commerce, Washington, DC, 1970), p. 1195.Google Scholar
14. Wilkens, M., Phys. Stat. Sol. (a). 2 (1970), 359.Google Scholar
15. Weertman, J. and Weertman, J. R., Elementary Dislocation Theory, MacMillan, New York, 1964, p. 55.Google Scholar
16. Vermeulen, A. C., Delhez, R. and Mittemeijer, E. J., Mater. Res. Soc. Proc. 230 (1992), 103.Google Scholar