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X-ray Diffraction of Plasma Nitrided Ti-6AI-4V

Published online by Cambridge University Press:  06 March 2019

A. Raveh ,
G. Kimmel ,
R. Avni  and
A. Grill
A. Raveh
Affiliation:
also at NRC-Negev, P.O.Box 9001, Beer-sheva 84190, ISRAEL.
G. Kimmel
Affiliation:
Dept, of Mater. Eng-., Technion, Haifa 32000, ISRAEL
R. Avni
Affiliation:
also at NRC-Negev, P.O.Box 9001, Beer-sheva 84190, ISRAEL.
A. Grill
Affiliation:
Materials Engr. Dept., Ben-Gurion University of the Negev, P.O.Box 653, Beer-Sheva, ISRAEL
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Abstract

Ti-6Al-4V alloy has been nitrided in plasmas of N2 -H2 -Ar. The structure has been characterized by X-ray diffraction (XRD) for the determination of the products formed. The information was supported by elemental analysis with Auger Electron Spectroscopy (AES).

Three phases were identified as follows: δ-TiN, ε-Ti2N and α'-Ti (solid solution of nitrogen in titanium). The gas-feed composition affects the nitriding process as found from phase orientation and relative concentration of the products.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 33: Thirty-Eighth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1989 , 1989 , pp. 129 - 135
Copyright
Copyright © International Centre for Diffraction Data 1989

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References

1. Manory, R. R. and Kimmel, G., Thin Solid Films 150. 277 (1987).Google Scholar
2. Valvoda, V., Cerny, R., Kuzel, R.,Jr., Dobiasova, L., Musil, J., Poulex, V. and Vyskocil, J., Thin Solid Films 170, 201 (1989).Google Scholar
3. Raveh, A., Kimmel, G., Carmi, U., Inspektor, A., Grill, A. and Avni, R., Surface and Coatings Technology. 36, 183 (1988).Google Scholar
4. Raveh, A., Avni, R. and Grill, A., to be publ. in Thin Solid Films (1989).Google Scholar
5. Pearson, W. B., Handbook of Lattice Spacing and Structure of Metals and Alloys (Vol.4). Pergamon Press, 1965.Google Scholar
6. Kimmel, G., “Program XRIC (X-Ray Intensities Computations)”, Rep #878, Philips Lab. Briarcliff Manor, NY, 1986.Google Scholar
7. Toth, L. E., Transition Metal Carbides and Nitrides. Academic Press, New York 1971.Google Scholar
8. Sundgren, J. E., Johansson, B. O., Hentzell, H. T. G. and Karlsson, S. E., Thin Solid Films 105, 385 (1983).Google Scholar
9. Noel, J. P., Houghton, D. C., Este, G., Shepherd, F. R. and Plattner, H., J. Vac. Sci. Technol. A2. 284 (1984).Google Scholar
10. Metals Handbook. 8th ed. (American Society of Metals, 1973). Vol.8. pp 322 and 369.Google Scholar
11. Rie, K. T. and Lampe, Th., Metallberflaeche 37. 1003 (1983).Google Scholar