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X-Ray Emission Spectrographic Analysis of High-Purity Rare-Earth Oxides

Published online by Cambridge University Press:  06 March 2019

Farrel W. Lytle  and
Howard H. Heady
Farrel W. Lytle
Affiliation:
U. S. Bureau of Mines, Reno, Nevada
Howard H. Heady
Affiliation:
U. S. Bureau of Mines, Reno, Nevada
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Abstract

Minor amounts of rare-earth elements (0.01 to 1.0%) in high-purity rare-earth oxides may be determined by a fluorescent X-ray procedure. The analysis of high-purity yttrium, cerium, praseodymium, neodymium, and samarium is described. Basic to the method is accurate determination of spectral line intensity above background. Sample and standard preparation, choice of analytical lines, and utilization of a helium path to increase X-ray intensities are discussed. Precision and accuracy were evaluated by analyzing samples of known composition. The average of five separate determinations showed an average error of about 10 per cent.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 2: Seventh Annual Conference on Industrial Applications of X-ray Analysis, August 13-15, 1958 , 1958 , pp. 333 - 339
Copyright
Copyright © International Centre for Diffraction Data 1958

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References

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