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X-Ray Fluorescence Spectroscopy as a Technique for Studying Surface Concentration Profiles of Heterogeneous Catalysts

Published online by Cambridge University Press:  06 March 2019

Eva M. Kenny  and
Burton J. Palmer
Eva M. Kenny
Affiliation:
Halcon Research 1 Philips Parkway, Montvale, New Jersey
Burton J. Palmer
Affiliation:
Halcon Research 1 Philips Parkway, Montvale, New Jersey
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Abstract

X-ray fluorescence spectroscopy is usually not considered a surface technique in the same sense as ESCA or Auger spectroscopies. However, it can be a useful tool in studying the “surface” and bulk concentrations of elements in heterogeneous catalysts. The “surface” is defined by the effective penetration depth of the analyte line of the element of interest in a specific matrix. In the example which is presented, silver on alumina, the “surface” using the Ag KB1,3 is defined by a shell 3000 microns deep while for the Ag LAI it is 15 microns. Two methods of sample preparation are discussed and data obtained using three different calculation methods is presented. Data from the x-ray fluorescence method is compared to the silver depth profile in the alumina pellets obtained by electron microprobe analysis. The XRFS method allows rapid screening of many catalyst samples for the fraction of the cost of the microprobe technique.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 529 - 537
Copyright
Copyright © International Centre for Diffraction Data 1985

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