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X- ray photoelectron spectroscopic study of layer charge magnitude in micas and illite-smectite clays

Published online by Cambridge University Press:  09 July 2018

W. D. Johns  and
S. Gier
W. D. Johns*
Affiliation:
Department of Geological Sciences, University of Missouri, ColumbiaMO, USA
S. Gier
Affiliation:
Institute of Petrology, University of Vienna, Althanstraûe 14, 1090 Vienna, Austria
*
*E-mail: johns@missouri.edu
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Abstract

X-ray photoelectron spectroscopy (XPS) was used to determine the surface-charge magnitude and distribution for some micas and high-illite I-S clays. Based on predictable layer by layer atomic ratios for margarite, muscovite and sericite it was possible to establish an escape depth of ∼15 Å for photoelectrons. After the replacement of surface ions by Ba2+, interlayer ion (Ca, K, Na)/Ba ratios are a measure of the relative layer charges on external surfaces and the first internal interlayer. These ratios can be used to assign charge magnitudes and ascertain layer charge asymmetry when it occurs. The O/Ba ratios determined by XPS serve the same purpose. Diagenetic I-S from the Vienna Basin gives an XPS-determined symmetrical layer charge of 0.41; in a similar clay from the Gulf Coast sequence, the outer surface is smectitic, with an external charge of 0.21, in contrast to an opposing silica layer with a charge of 0.31.

Keywords

clay mineralsillitemicassurface chargeX-ray photoelectron spectroscopy (XPS)
Type
Research Article
Information
Clay Minerals , Volume 36 , Issue 3 , September 2001 , pp. 355 - 367
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 2001

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