Hostname: page-component-cd9895bd7-8ctnn Total loading time: 0 Render date: 2024-12-27T10:18:53.329Z Has data issue: false hasContentIssue false
  • English
  • Français

Structure Defects in Layer Silicate Clay Minerals

Published online by Cambridge University Press:  02 April 2024

A. K. De ,
S. Bhattacherjee  and
G. B. Mitra
A. K. De
Affiliation:
School of X-rays and Structure of Matter, Department of Physics, Indian Institute of Technology, Kharagpur, India 721302
S. Bhattacherjee
Affiliation:
School of X-rays and Structure of Matter, Department of Physics, Indian Institute of Technology, Kharagpur, India 721302
G. B. Mitra
Affiliation:
School of X-rays and Structure of Matter, Department of Physics, Indian Institute of Technology, Kharagpur, India 721302
Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'

Keywords

DefectsDiffraction line profileFourier coefficientsKaoliniteLayer shiftNontronite
Type
Notes
Information
Clays and Clay Minerals , Volume 31 , Issue 4 , August 1983 , pp. 315 - 316
Copyright
Copyright © 1983, The Clay Minerals Society

References

Mitra, G. B. and Bhattacherjee, S., 1969 X-ray diffraction studies on the transformation of kaolinite into metakaolin: I. Variability of interlayer spacing Amer. Mineral. 54 1409–1418.Google Scholar
Mitra, G. B. and Bhattacherjee, S., 1969 Layer disorders in kaolinite during dehydration Acta Crystallogr. B5 1668–1669.CrossRefGoogle Scholar
Mitra, G. B. and Bhattacherjee, S., 1970 X-ray diffraction studies on the transformation of kaolinite into metakaolin Acta Crystallogr. B26 2124–2128.CrossRefGoogle Scholar
Wilson, A. J. C., 1962 X-ray Optics London Methuen & Co. 73–74.Google Scholar
Wilson, A. J. C., 1963 Mathematical Theory of X-ray Powder Diffractometry The Netherlands Philips Technical Library 98.Google Scholar