Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-10T09:03:37.175Z Has data issue: false hasContentIssue false
  • English
  • Français

Transmission Electron Microscope Data for Rectorite: Implications for the Origin and Structure of “Fundamental Particles”

Published online by Cambridge University Press:  02 April 2024

Jung Ho Ahn  and
Donald R. Peacor
Jung Ho Ahn
Affiliation:
Department of Geological Sciences, The University of Michigan, Ann Arbor, Michigan 48109
Donald R. Peacor
Affiliation:
Department of Geological Sciences, The University of Michigan, Ann Arbor, Michigan 48109
Rights & Permissions [Opens in a new window]

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Alternating mica-like and smectite-like layers of rectorite give rise to periodically varying contrast in 10-Å lattice fringes, yielding a periodicity of 20 Å in a transmission electron microscopic study. Expansion of rectorite using dodecylamine hydrochloride yields a three-layer repeat of thickness 32–35 Å, consisting of a basic 20-Å unit, identical to that in images of collapsed, dehydrated rectorite, and a 12-15-Å thick, intercalated organic layer.

Thin packets of layers derived by grinding the sample are only 20 Å thick, or multiples thereof. Serrated edges of rectorite grains likewise have steps 20 Å in height, implying that mechanical cleavage occurs readily along the weakly bonded, smectite-like interlayers. The “fundamental” 20-Å unit is proposed to be compositionally centered on an interlayer bounded by two identical T-O-T layers, each of which has compositionally different tetrahedral sheets. Such structural considerations suggest that resultant 20-Å units (“rectorite units”) are unique in structure and chemistry relative to true illite. These results further imply that grinding and other treatment of coherent crystals of clay minerals may produce individual unit layers. Moreover, when coupled with size-separation, such treatment may yield X-ray powder diffraction data that reflect reconstituted layer sequences.

Keywords

“Fundamental particles,”IlliteInterstratificationLattice fringe imagesRectoriteSmectiteTransmission electron microscopy
Type
Research Article
Information
Clays and Clay Minerals , Volume 34 , Issue 2 , April 1986 , pp. 180 - 186
Copyright
Copyright © 1986, The Clay Minerals Society

Footnotes

1

Contribution No. 414, The Mineralogical Laboratory, Department of Geological Sciences, The University of Michigan, Ann Arbor, Michigan 48109.

References

Ahn, J. H. and Peacor, D. R., 1984 The smectite to illite transformation in Gulf Coast argillaceous sediments based on microstructure by TEM/AEM Program with Abstracts, 21st Annual Meeting of The Clay Minerals Society, Baton Rouge, Louisiana, 1984 22.Google Scholar
Ahn, J. H. and Peacor, D. R., 1986 A transmission and analytical electron microscopic study of the smectite-to-illite transition Clays & Clay Minerals 34 165–179.Google Scholar
Bailey, S. W., 1982 Nomenclature for regular interstratifications Amer. Mineral. 67 394–398.Google Scholar
Hower, J. and Bailey, S. W., 1967 Order of mixed-layering in illite/mont-morillonites Clays and Clay Minerals, Proc. 15th Natl. Conf., Pittsburgh, Pennsylvania, 1966 New York Pergamon Press 63–74.Google Scholar
Hower, J., Eslinger, E. V., Hower, M. E. and Perry, E. A., 1976 Mechanism of burial metamorphism of argillaceous sediment: 1. Mineralogical and chemical evidence Geol. Soc. Amer. Bull. 87 725–737.2.0.CO;2>CrossRefGoogle Scholar
Iijima, S. and Buseck, P. R., 1978 Experimental study of disordered mica structures by high-resolution electron microscopy Acta Crystallogr. A34 709–719.CrossRefGoogle Scholar
Klimentidis, R. E. and Mackinnon, I. D. R., 1984 High resolution electron microscopy of mixed-layer clays Program with Abstracts, 21st Annual Meeting of The Clay Minerals Society Louisiana Baton Rouge 22.Google Scholar
Klimentidis, R. E. and Mackinnon, I. D. R., 1986 High-resolution imaging of ordered mixed-layer clays Clays & Clay Minerals 34 155–164.CrossRefGoogle Scholar
Lee, J. H., Ahn, J. H. and Peacor, D. R., 1985 Textures in layered silicates: progressive changes through diagenesis and low-temperature metamorphism J. Sed. Petrol. 55 532–540.Google Scholar
Lee, J. H. and Peacor, D. R., 1986 Expansion of smectite by laurylamine hydrochloride: ambiguities in transmission electron microscope observations Clays & Clay Minerals 34 69–73.CrossRefGoogle Scholar
Mackinnon, I. D. R. (1986) On the fundamental nature of illite/smectite mixed-layer clay particles: Clays & Clay Minerals 34 (in press).Google Scholar
McKee, T. R., Buseck, P. R. and Sturgess, J. M., 1978 HRTEM observation of stacking and ordered interstratification in rectorite Electron Microscopy 1978, vol. 1 Toronto, Canada Microscopical Society of Canada 272–273.Google Scholar
Miser, H. D. and Milton, C. (1964) Quartz, rectorite, and cookeite from the Jeffrey Quarry near North Little Rock, Pulaski County, Arkansas: Arkansas Geol. Comm. Bull. 21, 29 pp.Google Scholar
Nadeau, P. H., Tait, J. M., McHardy, W. J. and Wilson, M. J., 1984 Interstratified XRD characteristics of physical mixtures of elementary clay particles Clay Miner. 19 67–76.CrossRefGoogle Scholar
Nadeau, P. H., Wilson, M. J., McHardy, W. J. and Tait, J. M., 1984 Interstratified clays as fundamental particles Science 225 923–925.CrossRefGoogle ScholarPubMed
Nadeau, P. H., Wilson, M. J., McHardy, W. J. and Tait, J. M., 1984 Interparticle diffraction: a new concept for interstratified clays Clay Miner. 19 757–769.CrossRefGoogle Scholar
Veblen, D. R., 1983 Microstructures and mixed layering in intergrown wonesite, chlorite, talc, biotite, and kaolinite Amer. Mineral. 68 566–580.Google Scholar
Yoshida, T., 1973 Elementary layers in the interstratified clay minerals as revealed by electron microscopy Clays & Clay Minerals 21 413–420.CrossRefGoogle Scholar
Yoshida, T. and Suito, E., 1972 Interstratified layer structure of the organo-montmorillonites as revealed by electron microscopy J. Appl. Crystallogr. 5 119–124.CrossRefGoogle Scholar