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Thin-film-growth models: roughness and correlation functions

Published online by Cambridge University Press:  25 September 2002

DIRK BLÖMKER ,
CHRISTOPH GUGG  and
MARTIN RAIBLE
DIRK BLÖMKER
Affiliation:
Institut für Mathematik, RWTH Aachen, 52062 Aachen, Germany; email: bloemker@instmath.rwth-aachen.de
CHRISTOPH GUGG
Affiliation:
Institut für Mathematik, Universität Augsburg, 86135 Augsburg, Germany; email: christoph.gugg@math.uni-augsburg.de
MARTIN RAIBLE
Affiliation:
Theoretische Physik I, Institut für Physik, Universität Augsburg, 86135 Augsburg, Germany; email: martin.raible@physik.uni-augsburg.de
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Abstract

Surfaces arising in amorphous thin-film-growth are often described by certain classes of stochastic PDEs. In this paper we address the question of existence of a solution and statistical quantities (e.g. mean interface width or correlation functions). Moreover, we discuss the approximations of such statistical quantities by the spectral Galerkin method. This is an important question, as the numerical computation of statistical quantities plays a key role in the verification of the models.

Information

Type
Research Article
Information
European Journal of Applied Mathematics , Volume 13 , Issue 4 , August 2002 , pp. 385 - 402
Copyright
2002 Cambridge University Press

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